Profilometry via Optical Frequency Conversion for Extreme Reflection
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Solution Overview
Problem
Current profilometry systems are limited in measuring objects with extreme reflection levels, including very bright or dark objects, using ultraviolet (UV), visible, near-infrared (NIR), or infrared (IR) light, and cannot effectively handle scenarios with no reflection or fluorescence.
Innovation Solution
The development of novel profilometry systems and methods based on moiré techniques combined with optical frequency conversion, utilizing IR detectors and light sources across various wavelengths to convert absorbed radiation into measurable heat or fluorescence, allowing for profile measurement regardless of reflection levels or surface properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional profilometry systems use reflected light to measure object profiles, then measurements can be obtained from objects with some reflection, but the systems fail when objects have extreme reflection levels (very bright or very dark objects) or no reflection
Solution Approach 1:
The patent introduces an intermediary substance (fluorescent material or heat-absorbing material) that mediates between the light source and the object surface. This intermediary converts incident light into a measurable signal (fluorescence or heat) that can be detected regardless of the object's reflection properties, enabling measurement of objects with extreme reflection levels or no reflection.
Solution Approach 2:
The patent changes the measurement parameter from reflected light intensity to absorbed radiation converted into measurable signals (fluorescence or heat). By transforming the detection basis from reflection-based to absorption-based measurement, the system can accurately measure objects with extreme reflection levels, no reflection, or non-reflective surfaces.
2Adaptability or versatility
If the system uses absorption and optical frequency conversion to measure objects, then measurement capability extends to objects with extreme reflection levels or no reflection, but the system complexity increases
Solution Approach 1:
The patent employs a multi-functional detection system that can operate in multiple modes: fluorescence detection mode, heat detection mode, and combined mode. The same apparatus can measure different types of objects (reflective, non-reflective, fluorescent) by selecting appropriate detection parameters, providing universal measurement capability across diverse object properties without requiring entirely separate systems for each measurement type.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate profiling of objects with extreme reflection levels or no reflection by converting absorbed radiation into measurable signals, such as heat or fluorescence, using IR detectors and light sources across different wavelengths, enhancing measurement capabilities beyond conventional methods.
Implementation Method 1
a frequency of the resulting radiation is converted due to the absorption and emission of radiation by the object
Implementation Method 2
novel measurement techniques based on moiré techniques and optical frequency conversion
Implementation Method 3
the delivered radiation induces fluorescence in the object
Implementation Method 4
the detector comprises an IR detector
Implementation Method 5
the detector images the object at a fluorescence wavelength
Data Source
AI summary
Novel measurement techniques based on moiré techniques and optical frequency conversion. For example, in the IR realm, the configuration can be any moiré configuration, the detector is an IR detector, and the light source can be at any wavelength. The optical configuration, the detector, and the type of light source depend on the physical properties of object/scene and the parameter(s) to be measured.