Programmable D2D Link Path Testing for Defect and Aging Detection
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Solution Overview
Problem
Existing semiconductor devices with die-to-die communication links face challenges in effectively testing transmission paths due to varying defect types and aging, as traditional fixed pattern generators are inadequate for differentiating defects and adapting to changing conditions.
Innovation Solution
Implementing programmable test circuits with programmable test patterns and conditions for die-to-die paths, allowing flexible testing through transmitter and receiver test circuits with programmable pattern circuits and control circuits, enabling adaptive testing based on defect profiles and aging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If fixed pattern generators are used for testing die-to-die paths, then the testing circuit is simple and fixed, but the ability to differentiate defect types and adapt to aging is insufficient
Solution Approach 1:
The patent applies the Dynamics principle by transforming the static, fixed pattern generator into a dynamic, programmable test circuit. The test circuit can now be reconfigured through programming to adapt to different defect types and aging conditions, while maintaining a relatively fixed hardware structure. This allows the same physical circuit to exhibit different testing behaviors based on programming, resolving the contradiction between adaptability and complexity.
Solution Approach 2:
The patent implements parameter changes by allowing the test pattern parameters to be modified through programming rather than being fixed at manufacturing. The programmable test circuit can change testing parameters such as pattern selection, test conditions, and evaluation criteria based on the specific defect profile or aging stage being tested, thereby improving adaptability without requiring multiple different hardware circuits.
2Reliability
If programmable test circuits are implemented, then the adaptability to different defect types and aging conditions improves, but the device complexity increases
Solution Approach 1:
The patent applies the Universality principle by designing a single programmable test circuit that can perform multiple testing functions for different defect types and aging conditions. Instead of creating separate dedicated test circuits for each testing scenario, the programmable circuit can be configured through software/firmware to handle various test patterns and conditions, thereby improving reliability while controlling the increase in hardware complexity.
Solution Approach 2:
The patent introduces a programming interface and control logic as an intermediary between the user/test system and the physical test circuit. This intermediary layer allows complex testing behaviors to be achieved through programming rather than hardware complexity, enabling the test circuit to adapt to different scenarios without proportionally increasing its structural complexity.
Data Source
AI summary
In some embodiments, circuitry for implementing programmable die-to-die path test patterns is provided. A D2D link may include latches for transmitting data through a path between first and second dies and also may include transmit and receive test control circuits for programming desired patterns to be driven through the path in order to test it.