Programmable IC Testing via Segmented Test Patterns

The patent segments the testing process into two distinct test patterns: a first test pattern that tests user design functionality, and a second test pattern that tests additional functionality. By separating the testing of user design resources from test overhead resources, the method allows functional devices to pass even if test overhead resources have defects, thereby improving manufacturing yield while maintaining adequate testing thoroughness for user design functionality.

The patent applies partial action by requiring only one successful test pattern (preferably the first test pattern) to pass for device acceptance, rather than requiring both test patterns to pass. This partial requirement approach ensures that devices with defects in test overhead resources (tested by the second pattern) can still be accepted if their user design functionality (tested by the first pattern) is sound, thus improving yield without completely sacrificing testing thoroughness.

The testing process is segmented into two independent test patterns that can be executed efficiently. The first test pattern focuses on user design functionality, and the second test pattern covers additional functionality. This segmentation allows testing to be performed in a structured manner that maintains comprehensive quality assessment while optimizing testing time by not requiring both patterns to pass for device acceptance.

By requiring only partial testing success (one out of two test patterns passing), the method achieves adequate device quality assurance without the full time cost of requiring both comprehensive test patterns to pass. This partial action approach balances reliability with testing efficiency.

The patent segments defect detection into two test patterns with different scopes. The first test pattern detects defects in user design resources, while the second test pattern detects defects in additional functionality resources. By segmenting the testing scope and accepting devices based on partial success, the method maintains adequate defect detection capability while reducing the cost impact of comprehensive testing.

The method applies partial action by accepting devices if at least one test pattern passes, rather than requiring complete success of all test patterns. This approach maintains sufficient defect detection for user design functionality while reducing the stringent cost burden of requiring all resources to be defect-free, thereby improving ease of manufacture.