Programmable Memory Cell Structure Without Extra Masking Steps

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Solution Overview

Problem

Existing memory technologies fail to address the need for adaptable and cost-effective programmable memory cells suitable for various circuits without requiring additional masking steps.

Innovation Solution

A programmable memory cell design comprising a semiconductor substrate with insulated conductive walls, a first conductivity type and a second conductivity type, and a second conductivity type, and a second conductivity type, with capacitive coupling ratios and electrical fields applied to program and sense values, utilizing MOSFET transistors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If memory cells are adapted to different technologies, then versatility is improved, but manufacturing complexity increases due to additional masking steps

Engineering Contradiction:
Improveadaptability to different circuitsVSAvoidmasking steps
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The memory cell design uses a universal structure with a semiconductor substrate, insulated conductive walls, and doped regions that can be programmed through electrical field application. This multi-functional design allows the same cell structure to be adapted to different circuit technologies (P-type and N-type conductivity) without requiring additional masking steps, resolving the contradiction between versatility and manufacturing complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of operation

If programming is achieved through electrical field application, then ease of operation is improved, but energy consumption increases

Engineering Contradiction:
Improveprogramming operationVSAvoidenergy for programming
Core Design Contradiction:
Ease of operationVSUse of energy by moving object

Solution Approach 1:

The patent employs controlled parameter changes in the electrical field (applying fields between 5 MV/cm and 10 MV/cm) to program the memory cell. By optimizing the electrical field strength within this specific range, the invention achieves effective programming operation while minimizing energy consumption, balancing ease of operation with energy efficiency

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables adaptable programmable memory cells suitable for various circuits using existing MOSFET transistor manufacturing processes without additional masking steps, allowing programming and sensing with low voltages.

Implementation Method 1

programming a first value into the memory cell by applying an electrical field comprised between 5 MV/cm and 10 MV/cm between the first region and the second layer

Methodology Applied
Scientific EffectElectrical field effect: Electric Field

Implementation Method 2

programming a second value into the memory cell by applying an electrical field comprised between 5 MV/cm and 10 MV/cm between the third region and the second layer

Methodology Applied
Scientific EffectElectrical field effect: Electric Field

Implementation Method 3

the second region comprising second top parts, the second top parts forming a transistor with the first and second layers

Methodology Applied
Scientific EffectMOSFET transistor effect:

Data Source

PatentUS12526992B2Memory cell
Publication Date: 2026.01.13 STMICROELECTRONICS INT NV
  • US12526992B2 patent drawing
  • US12526992B2 patent drawing
  • US12526992B2 patent drawing

AI summary

A memory cell includes first, second, and third semiconductor regions laterally bounded by insulated conductive walls; a first insulating layer overlaying the first, second, and third semiconductor regions; and a second conductive layer disposed facing a part of each of first, second, and third semiconductor regions. A first top part of the first semiconductor region is first conductivity type doped and faces the second conductive layer. The second semiconductor region includes second top parts forming a transistor with the first insulating layer and second conductive layer. A third top part of the third semiconductor region is second conductivity type doped and faces the second conductive layer. To program the memory cell, an electrical field is applied between the first semiconductor region and the second conductive layer and electrical field is applied between the third semiconductor region and the second conductive layer.