Programmable Modular Circuit for SoC Testing and Control
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Solution Overview
Problem
Conventional system-on-a-chip (SoC) designs face challenges in testing and modifying the operating characteristics of multiple integrated circuits after fabrication, making it difficult to assess and alter their functions.
Innovation Solution
A programmable modular circuit comprising serial-to-parallel interface registers connected by data, clock, and enable lines allows for serial data transfer to modify or test SoC modules, enabling remote reprogramming and control of operating characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional SoC designs are used to integrate multiple circuits in a single chip, then power consumption is reduced and cost is lowered, but access to multiple circuits for testing and modification after fabrication is limited
Solution Approach 1:
The invention segments the SoC into multiple independently controllable modules, each with its own control register. This segmentation allows individual modules to be accessed, tested, and modified separately after fabrication, resolving the contradiction between integrated reliability and post-fabrication accessibility.
Solution Approach 2:
The invention introduces an intermediary control mechanism consisting of serial-to-parallel interface registers that mediate between external testing equipment and internal SoC modules. This intermediary layer enables post-fabrication access without compromising the integrated structure, allowing individual module control while maintaining overall system reliability.
2Ease of manufacture
If conventional SoC designs are used, then manufacturing cost is reduced, but testing and modification of individual circuits after fabrication becomes difficult or impossible
Solution Approach 1:
The invention implements preliminary action by pre-configuring serial-to-parallel interface registers and control mechanisms during the fabrication process. These pre-built interfaces enable easy post-fabrication testing and modification without requiring complex external circuitry, thus maintaining manufacturing simplicity while enabling future testing capabilities.
Solution Approach 2:
The control registers serve multiple functions: they act as interface buffers during fabrication, configuration storage during operation, and testing control points after deployment. This multi-functionality allows a single inexpensive structure to enable both manufacturing efficiency and post-fabrication testing.
3Adaptability or versatility
If data is serially clocked into multiple interface registers, then reconfigurability is improved, but data transfer time increases
Solution Approach 1:
The invention uses periodic clock signals to serially transfer data to multiple interface registers in a systematic sequence. This periodic action enables comprehensive reconfiguration of all modules while maintaining timing predictability, balancing reconfigurability with acceptable data transfer time through efficient use of clock cycles.
Data Source
AI summary
The present invention provides a programmable modular circuit for testing and controlling a system-on-a-chip integrated circuit, and applications thereof. In an embodiment, the programmable modular circuit comprises a plurality of serial-to-parallel interface registers coupled together by a data line, a clock line, and an enable line. Each of the plurality of serial-to-parallel interface registers is coupled to a module of the system-on-a-chip. The data line and the clock line are used to serially clock data into the plurality of serial-to-parallel interface registers. Applying a first logical value to the enable line provides the data serially clocked into the plurality of serial-to-parallel interface registers to modules of the system-on-a-chip. Applying a second logical value to the enable line provides default values to modules of the system-on-a-chip. The data values serially clocked into the plurality of serial-to-parallel interface registers can be used to test and/or to modify selected operating characteristics of the system-on-a-chip.