Programmable Test System for Fast Signal Transition Detection
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Solution Overview
Problem
Current semiconductor device testers require extensive time to develop and execute tests, which delays the production of new designs and reduces manufacturing throughput due to the inefficiencies in detecting signal transitions within the testing process.
Innovation Solution
A programmable automatic test system that allows for customized timing of signal transitions by specifying a window within a repeated waveform, reducing the need for extensive 'walking strobe' methods and enabling faster detection of signal transitions through programmable strobing circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional walking strobe methods are used to detect signal transitions, then measurement precision is improved, but test execution time increases significantly
Solution Approach 1:
The system performs preliminary actions by pre-defining the programmable window parameters (start time, duration, sampling rate) before execution. The strobe circuit is pre-configured with the window specifications, allowing rapid signal transition detection without time-consuming walking strobe methods during actual testing.
Solution Approach 2:
The invention changes the parameters of signal sampling by introducing a programmable window with adjustable start time, duration, and sampling rate. This allows the system to optimize detection parameters for different signal characteristics, achieving both precision and speed by adapting the sampling strategy rather than using fixed slow walking strobe methods.
2Manufacturing precision
If comprehensive testing of multiple test points is performed, then manufacturing precision is improved, but productivity decreases
Solution Approach 1:
The system segments the testing process by allowing selective testing of specific test points within a programmable window. Instead of systematically testing all test points sequentially (walking strobe), the system can focus on specific segments or windows where signal transitions are most likely to occur, achieving comprehensive testing of critical areas without the time penalty of exhaustive testing.
Solution Approach 2:
The invention applies partial action by enabling testers to sample signals at selected points within the programmable window rather than requiring complete systematic coverage. This allows testing of the most critical test points with appropriate sampling density, achieving sufficient manufacturing precision without the full time cost of exhaustive testing of all points.
3Measurement precision
If test programs are programmed with detailed operations and timing for each test point, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The system provides universality through a unified programmable window framework that can accommodate various testing scenarios. The same window mechanism handles different test points, signal types, and detection requirements by adjusting parameters rather than requiring separate programming approaches for each case, reducing overall programming complexity while maintaining precision.
Solution Approach 2:
The invention introduces dynamics by making the test window parameters adjustable and adaptable rather than fixed. The programmable window can dynamically adjust its start time, duration, and sampling rate based on the specific test requirements, allowing detailed control of test operations without the complexity of manually programming each timing detail for every possible scenario.
Data Source
AI summary
A test technique that may be implemented in an automated test system for testing semiconductor devices. The test technique may enable the fast detection of a signal transition, such as an edge, within a waveform and the timing of that event. Circuitry within a digital instrument that can be quickly and flexibly programmed may, at least in part, implement the test technique. That circuitry may be simply programmed with testing parameters, such that application of the technique may lead to faster test development and faster times. In operation, that circuitry receives parameters specifying parameters of a window over a waveform in which samples of the waveform will be taken to detect the signal transition. The circuitry may convert these parameters into control signals for other components in the test system, such as an edge generator or pin electronics, to take a programmed number of samples at desired times.