Programmable V/I Source Circuit for Force and Clamp Testing
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Solution Overview
Problem
Existing automatic test systems for electronic devices require separate circuits for functional and parametric tests, leading to a high component count and inability to selectively provide predetermined currents or voltages, as well as inadequate protection against overvoltage and overcurrent situations.
Innovation Solution
A V/I source comprising a diode quad with programmable current sources and an op-amp, capable of operating in force current/clamp voltage or force voltage/clamp current modes, using feedback lines and switches to regulate output, allowing for selective current or voltage provision and protection against excessive load conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate circuits are used for functional and parametric tests, then testing capabilities are comprehensive, but component count increases and system complexity increases
Solution Approach 1:
The patent combines separate functional test circuits and parametric test circuits into a single integrated V/I source circuit. This circuit can selectively operate in different modes (force current/clamp voltage or force voltage/clamp current) to perform both functional and parametric tests, thereby reducing component count while maintaining comprehensive testing capabilities
Solution Approach 2:
The V/I source circuit is designed as a universal circuit that can perform multiple functions: it can force current with voltage clamping for parametric tests, force voltage with current clamping for functional tests, and adapt its operation based on control signals. This multi-functionality eliminates the need for separate dedicated circuits for different test types
2Adaptability or versatility
If traditional active load circuits are used, then functional tests can be performed, but the ability to selectively provide predetermined currents or voltages is limited
Solution Approach 1:
The V/I source circuit incorporates dynamic switching capability through control signals that can change the circuit's operation mode in real-time. The circuit can dynamically transition between force current mode and force voltage mode based on external control signals, enabling selective provision of predetermined currents or voltages as required by different test conditions
Solution Approach 2:
The circuit allows changing its fundamental operating parameters (whether to force current or voltage) based on control signals. By changing the control signal state, the circuit transitions between different parameter regimes, enabling it to selectively provide predetermined currents or voltages with appropriate clamping, thereby improving adaptability and operational flexibility
3Reliability
If voltage or current limiting is not implemented, then circuit operation is simple, but device and equipment are vulnerable to overload damage
Solution Approach 1:
The V/I source circuit incorporates beforehand protection mechanisms through clamping diodes and control logic that prevent voltage or current from exceeding safe limits before damage can occur. The circuit is designed with inherent protection capabilities that automatically activate when threshold conditions are approached, protecting both the DUT and test equipment from overload damage without requiring complex external protection circuits
Data Source
AI summary
A voltage/current (V/I) source includes circuitry having first, second, third and fourth nodes, a first current source electrically connected to the first node, a second current source electrically connected to the second node, where the third and fourth nodes are between the first and second nodes, and an operational amplifier (op-amp) having an output, an inverting input, and a non-inverting input. The output is electrically connected to the third node, and the non-inverting input is electrically connected to a voltage source. A feedback line is between the fourth node and the inverting input.