Projection Device Image Correction Using Diffraction Spot Analysis

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Solution Overview

Problem

Current image correction methods, such as keystone correction, are inadequate for correcting image deformations caused by environmental factors like a non-flat projection screen, as they cannot address distortions in the horizontal direction or specific regions of the image.

Innovation Solution

A method using a projection device with a grating and light generation component to detect diffraction spots, determine target diffraction spots with varying diameters, and calculate corrected projection lengths based on angles between adjacent spots, allowing for localized correction of deformed regions without altering the entire image.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If keystone correction is used to correct image deformation, then vertical direction correction is achieved, but horizontal direction correction and regional correction are not possible

Engineering Contradiction:
Improvecorrection capabilityVSAvoidcorrection method limitation
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent divides the projection image into multiple regions (first region and second region) with different correction parameters. Each region has its own correction matrix that can be independently adjusted, enabling regional correction in both horizontal and vertical directions rather than applying a single global correction to the entire image.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent extends the correction capability from one dimension (vertical keystone correction) to two dimensions by introducing horizontal correction parameters and creating a comprehensive correction matrix that operates in both horizontal and vertical directions simultaneously.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If the entire projection image is corrected, then complete image correction is achieved, but computational complexity increases

Engineering Contradiction:
Improveimage correction accuracyVSAvoidcomputational complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the correction process into region-specific operations. Instead of calculating correction parameters for the entire image, the system divides the image into multiple regions and calculates correction parameters only for each region, reducing the overall computational complexity while maintaining correction accuracy.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different correction characteristics to different regions of the image. Each region has its own correction matrix tailored to the specific deformation characteristics of that area, allowing for precise local correction without the computational burden of processing the entire image uniformly.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If detection light is projected through the grating to generate diffraction spots, then regional deformation detection is enabled, but device complexity increases

Engineering Contradiction:
Improvedeformation detection accuracyVSAvoiddevice structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a grating as an intermediary component between the projection device and the screen. The grating modulates the detection light to create diffraction spots that encode information about the screen's deformation, enabling precise measurement of regional deformations without requiring complex direct measurement systems.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent uses diffraction spots created by the grating as optical copies or representations of the screen's deformation characteristics. By analyzing the positions and patterns of these diffraction spots, the system can infer the deformation state of the projection screen regions without directly measuring the screen itself.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables efficient correction of deformed regions in both horizontal and vertical directions, reducing computational complexity and improving correction efficiency by projecting diffraction spots generated through the grating onto the image.

Implementation Method 1

projecting diffraction spots generated through the grating by detection light onto the projection picture

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS11287646B2Method for correcting an image, storage medium and projection device
Publication Date: 2022.03.29 XIAN ZHONGXING NEW SOFTWARE
  • US11287646B2 patent drawing
  • US11287646B2 patent drawing
  • US11287646B2 patent drawing

AI summary

Disclosed is a method for correcting an image, a storage medium, and a projection device. The method is applied to a projection device, the projection device including a grating and a light generation component. The method includes: determining, in a region in which a projection image projected by the projection device overlaps with a projected image projected through the grating by detection light output from the projection device, diffraction spots having a diameter not equal to a preset value as target diffraction spots; determining a group of target diffraction spots continuously arranged in a horizontal or vertical direction, as well as diffraction spots having a diameter equal to the preset value that are respectively located on both sides of the group of target diffraction spots, as a region to be corrected; determining an angle αi between a plane of an ith diffraction spot and a plane of an (i+1)th diffraction spot that are adjacent in the horizontal or vertical direction in the region to be corrected; and determining a corrected projection length of the (i+1)th diffraction spot according to the preset value and angles α1 to αi.