Projection Surface Feature Detection Using Multi-Pattern Edge Overlays

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Solution Overview

Problem

Existing methods for extracting feature points from projection surfaces are inaccurate due to the dependence on the type of pattern projected, and users lack guidance on improving accuracy.

Innovation Solution

A display method that superimposes indication images on captured images to highlight feature portions, using multiple patterns and external light sources to enhance feature point detection accuracy, and a non-transitory storage medium storing a program to control the display of these images.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single pattern is projected onto the projection surface for feature point extraction, then the extraction process is simple, but the accuracy of feature point extraction varies and is unreliable under different environmental conditions

Engineering Contradiction:
Improvefeature point extraction accuracyVSAvoidpattern projection complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the feature point extraction process by using multiple different patterns (e.g., grayscale patterns, binary patterns, color patterns) instead of a single pattern. Each pattern type is optimized for specific extraction scenarios, allowing the system to segment the complexity and handle different environmental conditions with appropriate pattern types, thereby improving extraction accuracy without overwhelming complexity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies parameter changes by varying pattern parameters such as contrast, frequency, and type (grayscale, binary, color) to optimize feature point extraction under different environmental conditions. The system can change pattern parameters dynamically based on lighting conditions and surface properties, improving measurement precision while maintaining manageable system complexity through parameter optimization

Inventive Principle:
Principle #35Parameter changes

2Reliability

If multiple patterns are projected to improve feature point extraction accuracy, then extraction accuracy improves, but the system complexity increases

Engineering Contradiction:
Improvefeature point extraction reliabilityVSAvoidpattern projection system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements universality by designing a projection system that can perform multiple functions with a single device - projecting different pattern types (grayscale, binary, color) and performing different extraction algorithms. This multi-functionality approach improves reliability across various environmental conditions while avoiding the need for multiple separate projection devices, thereby managing system complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent applies dynamics by making the pattern projection system adaptive and changeable. The system can dynamically switch between different pattern types and adjust pattern parameters based on real-time environmental conditions and extraction requirements. This dynamic capability ensures reliable extraction across varying conditions while keeping the system manageable through intelligent control rather than fixed complex hardware

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If feature point extraction is performed without considering environmental light sources, then the process is simple, but the extraction accuracy deteriorates under varying environmental conditions and reflected light interference

Engineering Contradiction:
Improvefeature point extraction precisionVSAvoidenvironmental light interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent converts the harmful effect of environmental light sources and reflected light into a beneficial factor by using them as additional information sources. The system analyzes both the projected pattern and the reflected environmental light to extract feature points, transforming what would normally be interference into complementary data that improves extraction precision under varying environmental conditions

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent introduces an intermediary analysis process that separates and analyzes different light components (projected pattern light and environmental reflected light) before combining them for feature point extraction. This intermediary step filters and processes the light information to eliminate harmful interference while preserving useful signals, thereby improving measurement precision without requiring complete isolation from environmental light

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20260075172A1Display method, non-transitory computer-readable storage medium storing program, and information processing apparatus
Publication Date: 2026.03.12 SEIKO EPSON CORP
  • US20260075172A1 patent drawing
  • US20260075172A1 patent drawing
  • US20260075172A1 patent drawing

AI summary

A projection apparatus includes a projector configured to project an image onto a projection surface and a camera configured to capture the image of the projection surface. An information processing apparatus that communicates with the projection apparatus displays a first superimposition image obtained by superimposing, on a first captured image obtained by imaging, with the camera, the projection surface onto which a first pattern is projected from the projector, a first indication image indicating a first feature portion corresponding to an edge detected from the first captured image. The information processing apparatus displays a second superimposition image obtained by superimposing, on a second captured image obtained by imaging, with the camera, the projection surface onto which a second pattern is projected from the projector, a second indication image indicating a second feature portion corresponding to an edge detected from the second captured image.