Protocol Engine for Automatic Test Equipment
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Solution Overview
Problem
Current automated test equipment systems face challenges in testing system-on-a-chip (SOC) devices with non-deterministic behavior, as they lack the capability to accurately simulate the asynchronous communication and varying operational conditions, leading to prolonged testing and evaluation phases due to trial and error methods.
Innovation Solution
A protocol generation circuit, or protocol engine, is introduced within the automatic test equipment to generate stimulus signals and timings that comply with specified device protocols, allowing for accurate testing of SOC devices by retrieving and formatting protocol unique data according to the device's protocol definition, enabling efficient communication and response signal evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If deterministic test operations are used with fixed timing and structure, then test control is simplified, but the ability to test non-deterministic SOC devices is reduced
Solution Approach 1:
The test equipment transitions from static, predetermined timing to dynamic, adaptive timing that responds to the actual operational state of the SOC device. The system adjusts stimulus timing based on observed device behavior, enabling accurate testing of non-deterministic devices while maintaining operational simplicity through automated adaptation.
2Measurement precision
If custom functional test apparatuses are built for each SOC device, then testing accuracy is improved, but development cost and time increase
Solution Approach 1:
The test equipment is designed as a universal platform capable of testing multiple SOC device types through software-based protocol configurations rather than hardware customization. The system can adapt to different device protocols and testing requirements through programmable control, eliminating the need for custom hardware development for each device while maintaining high testing accuracy.
Solution Approach 2:
The system achieves device-specific testing accuracy by dynamically changing operational parameters such as timing sequences, stimulus patterns, and measurement criteria through software configuration. This allows a single physical apparatus to accurately test various SOC devices by adjusting parameters rather than requiring custom hardware for each device type.
3Adaptability or versatility
If trial and error methods are used to adjust test vectors, then device compatibility is improved, but testing time increases significantly
Solution Approach 1:
The system performs preliminary characterization of the SOC device to establish operational parameters, timing relationships, and protocol requirements before conducting formal testing. This advance preparation creates a optimized test configuration that eliminates the need for time-consuming trial and error adjustments during actual device testing, significantly reducing total testing time while maintaining compatibility.
Solution Approach 2:
The test equipment incorporates feedback mechanisms that monitor device responses in real-time and automatically adjust test vectors and timing parameters based on observed behavior. This closed-loop approach enables the system to adapt to device-specific characteristics during testing without requiring manual trial and error iterations, reducing testing time while ensuring device compatibility.
Data Source
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AI summary
In one embodiment, a protocol engine circuit for automatic test equipment, which includes a protocol generation circuit constructed to retrieve protocol unique data and format the protocol unique data with a selected protocol definition corresponding to a device under test for testing the device under test. The protocol generation circuit may be constructed to retrieve the selected protocol definition from a protocol definition table.