Superresolution Imaging via PSF Subtraction
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Solution Overview
Problem
Conventional optical imaging systems are limited by diffraction to a resolution of about half the wavelength of illumination, making it difficult to image biologically interesting nanostructures and semiconductor applications, while electron microscopy has disadvantages such as damage to living cells and susceptibility to electromagnetic fields.
Innovation Solution
A method and system for producing a high-resolution composite image by subtracting diffraction-limited images obtained with a focal spot and a focal ring, using a point spread function module and convolution module to simulate and combine images, effectively increasing resolution below the diffraction limit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional optical imaging is used, then the imaging system can operate with photons providing contrast mechanisms, but the resolution is limited to about half the wavelength of illumination
Solution Approach 1:
The imaging process is segmented into multiple acquisitions with different point-spread functions (focal spot and focal ring). By dividing the imaging task into separate measurements with distinct PSFs and then combining them through subtraction, the system achieves resolution beyond the conventional diffraction limit of a single optical system.
Solution Approach 2:
The system changes the point-spread function parameters by using different focal configurations (focal spot versus focal ring). This parameter variation allows the extraction of sub-diffraction information through mathematical processing, specifically by subtracting images obtained with different PSFs to enhance resolution.
2Measurement precision
If electron microscopy is used to achieve high resolution, then nanostructures can be imaged, but electrons cause extensive damage to living cells and require vacuum
Solution Approach 1:
The patent replaces the mechanical electron beam system with an optical system using photons. By substituting electrons with light and employing computational processing of multiple optical images with different point-spread functions, the system achieves high resolution without the harmful effects of electron beams on living cells.
Solution Approach 2:
The patent introduces computational image processing as an intermediary between the optical measurement and the final high-resolution image. By using mathematical operations (subtraction of images with different PSFs) as a mediator, the system extracts sub-diffraction information without requiring direct physical interaction that would damage the sample.
3Measurement precision
If electron microscopy is used, then high resolution can be achieved, but the system requires vacuum which is incompatible with life
Solution Approach 1:
The patent replaces the vacuum-based electron microscopy system with a photon-based optical system that operates in ambient conditions. This substitution maintains high resolution capability through computational methods while enabling imaging of living biological samples in their natural environment.
Solution Approach 2:
The system changes the operating conditions by using optical parameters (different point-spread functions) instead of electron beam parameters. This allows the imaging to be performed under physiological conditions compatible with life, while still achieving super-resolution through mathematical processing of multiple images.
4Adaptability or versatility
If conventional optical imaging is used, then photons can be used providing contrast mechanisms, but resolution is limited
Solution Approach 1:
The imaging process is divided into multiple acquisitions with different point-spread functions (focal spot and focal ring). By segmenting the measurement into separate optical images with distinct PSFs and then combining them through subtraction, the system achieves resolution beyond the conventional diffraction limit while maintaining photon-based contrast mechanisms.
Solution Approach 2:
The system changes the point-spread function parameters by using different focal configurations (focal spot versus focal ring) to extract sub-diffraction information. This parameter variation in the optical system allows super-resolution through mathematical processing while preserving the versatility of photon-based contrast mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The technique achieves high-resolution imaging of features far below the diffraction limit, enhancing contrast and sensitivity, and can be parallelized for high-speed imaging, overcoming the limitations of conventional optical microscopy.
Implementation Method 1
The resolution of optical imaging systems is limited by diffraction to about half the wavelength of illumination.
Data Source
AI summary
An imaging system is provided. The imaging system includes a point spread function (PSF) module producing a diffraction-limited image of a sample. A convolution module performs convolution of the diffraction-limited image with a first image of a focal spot having a first wavelength to produce a first simulated image. The convolution also performs convolution of the diffraction-limited image with a second image of a focal ring having a second wavelength to produce a second simulated image. A difference module subtracts said first simulated image and said second simulated image to produce said high resolution composite image.