Single-Shot Ptychography System for Fast Bio-Imaging

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Solution Overview

Problem

Ptychography techniques face limitations in temporal resolution, scanning precision, and space-bandwidth product, which restrict their application in imaging fast dynamics and achieving high resolution with a large field of view.

Innovation Solution

A single-shot ptychography system that simultaneously illuminates an object with tens or hundreds of partially overlapping beams, allowing for robust, fast imaging without scanning, and enabling single-exposure Fourier ptychography across various spectral regions, including the x-ray region.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional scanning ptychography is used to achieve high resolution imaging, then manufacturing precision and measurement precision are improved, but productivity and speed are worsened due to the need for sequential scanning

Engineering Contradiction:
Improveimaging resolutionVSAvoidimaging speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent segments the illumination into multiple independent beams that simultaneously illuminate different regions of the object. Each beam acts as an independent probing source, allowing parallel acquisition of diffraction patterns from multiple spatial locations, thereby eliminating the sequential scanning requirement while maintaining the interferometric measurement precision needed for high-resolution reconstruction.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from one-dimensional sequential scanning to two-dimensional parallel illumination by arranging multiple beams in a spatial array. This dimensional change allows simultaneous probing of multiple object regions, converting a time-consuming sequential process into a parallel operation that achieves both high resolution and fast imaging.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If scanning is performed to achieve accurate beam positioning and overlapping, then measurement precision is improved, but temporal resolution is worsened due to the time required for sequential measurements

Engineering Contradiction:
Improvebeam positioning accuracyVSAvoidtemporal resolution
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary positioning of multiple beams in a fixed spatial arrangement before the measurement process begins. The beam geometry and overlapping patterns are pre-configured to satisfy ptychographic requirements, eliminating the need for continuous scanning and adjustment during measurement. This preliminary setup enables both precise beam positioning and rapid data acquisition.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent replaces the mechanical scanning system with a static multi-beam optical arrangement. Instead of physically moving a single beam across the object, multiple beams are simultaneously generated and positioned using optical elements, substituting mechanical motion with optical field manipulation to achieve both precision and speed.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Device complexity

If a single beam is used for scanning to maintain system simplicity, then device complexity is minimized, but space-bandwidth product is worsened due to limited field of view and resolution simultaneously

Engineering Contradiction:
Improvesystem structureVSAvoidspace-bandwidth product
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The patent merges multiple beam functions into a single integrated optical system. Instead of using one beam that must scan across the entire field of view, multiple beams are combined in a fixed array configuration, each contributing to different spatial frequencies and regions. This merging enables the system to achieve a high space-bandwidth product by simultaneously capturing information from multiple spatial locations and angles.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent creates a multi-functional beam system where each beam serves multiple purposes: illuminating different object regions, providing diverse illumination angles for enhanced resolution, and contributing to different spatial frequency components. This universal beam array configuration allows the system to simultaneously achieve large field of view and high resolution without requiring complex mechanical scanning mechanisms.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach achieves diffraction limit resolution and a large field of view simultaneously, enhancing the capabilities of ptychographic microscopes for bio-imaging and other applications by combining the strengths of ptychography with ultra-fast imaging.

Implementation Method 1

a diffraction arrangement at a predetermined position with respect to said light input plane, the diffraction arrangement being configured for creating from input plane wave light structured light in the form of an array of illuminating beams forming a predetermined illumination pattern in the object plane

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 2

at least a first focusing assembly, a front focal plane of said first focusing assembly defining a location of the light input plane

Methodology Applied
Scientific EffectFocusing: Focusing

Data Source

PatentEP3350643B1Ptychography system
Publication Date: 2023.04.05 TECHNION RES & DEV FOUND LTD
  • EP3350643B1 patent drawingFigure 1A~1C
  • EP3350643B1 patent drawingFigure 2A~2H
  • EP3350643B1 patent drawingFigure 3A~3C

AI summary

A single-exposure ptychography system is presented. The system comprises an optical unit defining an light input plane, an imaging plane, and an object plane between the light input and output planes. The optical unit comprises at least a first focusing assembly, whose front focal plane defines a location of the light input plane; and a diffraction arrangement at a predetermined position with respect to the light input plane. The diffraction arrangement is configured to create from input plane wave light structured light in the form of an array of illuminating beams forming a predetermined illumination pattern in the object plane; thereby providing that each of the illuminating beams creates a different intensity pattern in a known region at the light output plane.