PUF Code Generation Using Non-Volatile Memory Cell Pair Comparison

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional PUF technologies used in security applications, especially with cryptographic hash modules, face hardware overhead and reduced entropy issues, compromising reliability and security when generating die-unique and random signatures.

Innovation Solution

A PUF code generating apparatus utilizing a non-volatile memory cell pair and a data sensing circuit, where the initial statuses of the memory cells are compared to produce a unique and random PUF code, leveraging resistive random-access memory (ReRAM), conductive bridging random-access memory (CBRAM), or phase change random-access memory (PCRAM) cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional art approach employs ECC based on helper data input to achieve ultrahigh reliability, then reliability is improved, but hardware overhead increases and entropy is reduced

Engineering Contradiction:
ImprovePUF reliabilityVSAvoidhardware overhead
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts and removes the ECC (Error Correction Code) helper data mechanism from the PUF system. By eliminating the need for helper data storage and processing, the invention directly reduces hardware overhead while maintaining reliability through a different approach - using the natural physical variations in non-volatile memory cells during manufacturing to inherently provide reliable unique identification without additional error correction infrastructure.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention changes the fundamental parameter of how reliability is achieved - shifting from software-based error correction (ECC with helper data) to hardware-inherent physical uniqueness. By leveraging the natural manufacturing variations in non-volatile memory cell characteristics (such as resistance values, threshold voltages, or charge retention properties), the system achieves reliability through physical parameter diversity rather than computational error correction.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If conventional art approach employs ECC based on helper data input to achieve ultrahigh reliability, then reliability is improved, but entropy is reduced resulting in security issues

Engineering Contradiction:
ImprovePUF reliabilityVSAvoidentropy
Core Design Contradiction:
ReliabilityVSLoss of information

Solution Approach 1:

The patent removes the helper data mechanism that inherently reduces entropy. By eliminating the need to store and process helper data, the system preserves the full entropy of the physical variations in memory cells, ensuring that the complete randomness and unpredictability of manufacturing variations are utilized for security purposes without being degraded by additional processing steps.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The non-volatile memory cells inherently provide their own unique identification through their natural physical variations. The system leverages the self-service property of manufacturing process variations to generate high-entropy unique identifiers without requiring external helper data or error correction mechanisms, thereby maintaining maximum entropy and security.

Inventive Principle:
Principle #25Self-service

3Device complexity

If non-volatile memory cell pair is used to generate PUF code by comparing initial statuses, then hardware overhead is reduced and entropy is maintained, but manufacturing precision requirements increase

Engineering Contradiction:
Improvehardware overheadVSAvoidinitial status consistency
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

Instead of trying to control and minimize manufacturing variations through precision engineering, the invention inverts the approach by deliberately leveraging these variations as the source of unique identification. The system reads the natural, uncontrolled physical states of non-volatile memory cells during manufacturing and uses these inherent differences to generate unique PUF codes, turning a potential quality control challenge into a security feature.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The invention changes the approach to handling manufacturing precision by shifting from controlling physical parameters to utilizing parameter diversity. Rather than ensuring uniformity through precision manufacturing, the system exploits the diversity in resistance, threshold voltage, or charge retention parameters that naturally arise during fabrication, converting manufacturing variability into a reliable source of unique device identification.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10572190B2Physical unclonable function code providing apparatus and providing method thereof
Publication Date: 2020.02.25 WINBOND ELECTRONICS CORP
  • US10572190B2 patent drawing
  • US10572190B2 patent drawing
  • US10572190B2 patent drawing

AI summary

A PUF code providing apparatus includes a non-volatile memory cell pair and a data sensing circuit. The sensing circuit is coupled to the non-volatile memory cell pair, reads two initial statuses of the non-volatile memory cell pair and generates a PUF code by comparing the two initial statuses of the non-volatile memory cell pair.