PUF Cell Remapping Using Delay-Time Screening for Reliable IDs
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Solution Overview
Problem
The existing methods for configuring Physically Unclonable Function (PUF) cell-pairs using physical parameter differences lead to errors and increased manufacturing costs due to discarded wafer availability, as differences in physical parameters between PUF cell-pairs can result in errors under certain conditions, necessitating the use of trimming methods.
Innovation Solution
A method and apparatus for remapping PUF cell-pairs by combining cells from two arrays, acquiring delay time information for transistor turn-on based on leakage current, and determining unique values based on these parameters, with a controller mapping and comparing physical parameters to generate unique information and remap cell-pairs that do not meet predetermined threshold values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If PUF cell-pairs are configured using physical parameter differences, then unique identification is achieved, but errors occur when parameter differences are within threshold values
Solution Approach 1:
The patent performs preliminary mapping of PUF cell-pairs before final configuration, measuring physical parameters in advance and identifying pairs with insufficient parameter differences. This allows proactive remapping of problematic pairs before they cause errors in unique identification, thus preventing reliability issues before they occur.
2Reliability
If trimming method is used to handle PUF cell-pairs with insufficient parameter differences, then errors are reduced, but wafer availability is lowered and manufacturing cost increases
Solution Approach 1:
Instead of discarding PUF cell-pairs with insufficient parameter differences, the patent changes the mapping parameters by remapping these pairs to different positions in the PUF array. This parameter change allows the same physical cells to be utilized effectively, maintaining wafer availability while ensuring reliable unique identification through adequate parameter differences in the remapped configuration.
3Reliability
If PUF cell-pairs are discarded to maintain identification accuracy, then errors are reduced, but manufacturing cost increases
Solution Approach 1:
The patent recovers PUF cell-pairs that would otherwise be discarded by implementing a remapping mechanism. Instead of permanently discarding pairs with insufficient parameter differences, the system temporarily identifies them, remaps them to appropriate positions, and recovers their utility for unique identification, thereby reducing waste and manufacturing costs while maintaining accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces manufacturing costs by minimizing errors and increasing wafer availability by effectively utilizing PUF cell-pairs through remapping, ensuring reliable unique identification without discarding wafer resources.
Implementation Method 1
acquiring physical parameters for each of the PUF cell-pairs, where the physical parameter may be delay time information required to turn on a transistor included in the PUF cell based on a leakage current
Data Source
AI summary
A method for physically unclonable function (PUF) cell-pair remapping includes combining PUF cell-pairs between PUF cells in a first array and PUF cells in a second array, acquiring physical parameters for each of the PUF cell-pairs, selecting PUF cell-pairs based on a comparison of the acquired parameters with a first reference, and remapping the selected PUF cell-pairs.