High Voltage Pulse Circuit Failure Diagnosis
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Solution Overview
Problem
High-voltage pulse generating circuits face failures due to short-circuit issues in semiconductor switches, leading to excessive voltage application and thermal destruction, which can cause cascading failures in other components.
Innovation Solution
A high-voltage pulse generating circuit with a failure diagnosing circuit that de-energizes the second semiconductor switch if the voltage across the first semiconductor switch and second semiconductor switch falls out of a normal range, preventing energy consumption by the diode and excessive current flow, and inhibiting switching command signals to prevent further failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Duration of action of moving object
If the first semiconductor switch is used to generate high-voltage pulses with short duration, then the pulse sharpness and duration are improved, but the risk of short-circuit failure and thermal destruction increases
Solution Approach 1:
The failure diagnosing circuit continuously monitors the voltage across the first semiconductor switch before failure occurs. By detecting abnormal voltage levels in advance, the system can take preventive action (stopping operation) before thermal destruction or cascading failures happen, thus resolving the contradiction between short pulse duration and component reliability
Solution Approach 2:
The failure diagnosing circuit provides real-time feedback on the voltage status of the first semiconductor switch. When the voltage falls outside the normal range, the circuit immediately stops the second semiconductor switch, creating a feedback loop that prevents failure propagation and maintains system reliability while allowing short-duration pulses
2Loss of time
If the voltage monitoring is continuously performed, then the detection speed of failure is improved, but the circuit complexity increases
Solution Approach 1:
The failure diagnosing circuit acts as an intermediary monitoring system that specifically watches the voltage across the first semiconductor switch. This targeted monitoring approach enables fast failure detection without requiring complex monitoring of all circuit parameters, thus resolving the contradiction between detection speed and circuit complexity
Solution Approach 2:
Instead of monitoring the entire circuit globally, the failure diagnosing circuit focuses monitoring resources on the critical first semiconductor switch voltage. This localized monitoring strategy achieves rapid failure detection with minimal additional circuit complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The circuit effectively detects and prevents short-circuit failures in the first semiconductor switch, preventing thermal destruction and cascading failures, ensuring the high-voltage pulse generating circuit operates safely and reliably with extremely short pulse durations.
Implementation Method 1
an induced energy is stored in the inductor when the first semiconductor switch is rendered conductive as the second semiconductor switch is turned on, and the inductor generates a high-voltage pulse when the first semiconductor switch is turned off
Data Source
AI summary
In a high voltage pulse generating circuit, inductive energy is accumulated in an inductor due to electrical continuity of a first semiconductor switch by turning on a second semiconductor switch, and a high voltage pulse is generated by the inductor due to turning off of the first semiconductor switch by turning off the second semiconductor switch. In the case where both edge voltages of the first semiconductor switch and the second semiconductor switch are off the normal range, a failure diagnosis circuit is provided for stopping drive of the second semiconductor switch.