Variable-Voltage Pulse Delay Circuit for Wide-Range Time Measurement
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Solution Overview
Problem
Conventional time measuring circuits face challenges in simultaneously achieving high resolution for micro time-length measurements and low resolution for long time-length measurements without increasing circuit size, requiring multiple modules or extensive structure modifications.
Innovation Solution
A time measuring circuit with a pulse delay circuit composed of multiple delay units, where the delay time of each unit is adjustable based on a variable drive voltage, allowing for flexible resolution settings without increasing circuit size, achieved through a drive voltage setting unit that generates digital data on the number of stages passed by a pulse signal within a predetermined period.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of delay units is increased to achieve high resolution for micro time-length measurement, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The delay time of each delay unit is made dynamically adjustable through a drive voltage setting unit that can vary the driving voltage level. This allows the same delay unit to provide different delay amounts depending on the voltage applied, enabling high resolution measurement with fewer physical delay units. The delay time τ is related to the driving voltage V by the relationship τ ∝ 1/V, allowing continuous adjustment of measurement resolution without increasing circuit size.
Solution Approach 2:
The invention changes the operational parameter (driving voltage) of the delay units to achieve variable delay times. By adjusting the drive voltage level, the delay time of each unit can be modified, allowing the system to adapt between high resolution (shorter delay per unit with higher voltage) and long time measurement (longer delay per unit with lower voltage) modes without requiring different circuit configurations.
2Measurement precision
If the delay time of each delay unit is decreased to achieve high resolution, then measurement precision is improved, but the circuit size must increase to measure long time lengths
Solution Approach 1:
Rather than using fixed short delay units that would require many stages for long time measurement, the invention uses dynamically adjustable delay units. The drive voltage setting unit can increase the delay time of each unit when measuring long time lengths, reducing the number of units needed in series while maintaining the ability to achieve high resolution when measuring short time lengths by decreasing individual delay times.
3Adaptability or versatility
If multiple time measuring modules are provided to meet different measurement requirements, then adaptability is improved, but device complexity increases
Solution Approach 1:
The invention creates a universal time measuring circuit that can handle both micro time-length and long time-length measurements through a single integrated design. The pulse delay circuit combined with the drive voltage setting unit serves multiple functions: it can measure short intervals with high resolution by applying higher voltages for shorter individual delays, and measure long intervals by applying lower voltages for longer individual delays, eliminating the need for separate specialized modules.
Data Source
AI summary
In a time measuring circuit, a pulse delay circuit is provided with a plurality of delay units. The pulse delay circuit is configured to transfer a pulse signal through the plurality of delay units while the pulse signal is delayed by the plurality of delay units. A delay time of each of the plurality of delay units depends on a level of a first drive voltage being input to each of the plurality of delay units. A generating circuit is configured to obtain a number of the delay units through which the pulse signal has passed within a predetermined period to generate, as time measurement data, digital data based on the obtained number. A first setting unit is configured to variably set the level of the first drive voltage being input to each of the plurality of delay units.