Pulse Signal Sampling with Delayed Multi-Point Time Resolution
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Solution Overview
Problem
Conventional methods for improving the time and frequency resolution of real-time oscilloscopes integrated with TDR or TDT functions are costly and complex, with limited success in reducing the rising time of pulse signals beyond 35 ps.
Innovation Solution
An electrical signal sampling device comprising a pulse signal source, a first sampling module, and a signal delay module, which generates N excitation signals to control the pulse signal source or sampling module, enabling N groups of signals per period, thereby improving time resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the bandwidth of the real-time oscilloscope is increased to improve time resolution, then the time resolution of TDR is improved, but the cost and complexity of the device increases significantly
Solution Approach 1:
The patent divides the sampling process into multiple segments by using multiple sampling points within one period of the pulse signal. The signal delay module creates N different delay times, allowing the sampling module to capture N groups of sampling signals in one period, effectively segmenting the sampling process to achieve high time resolution without requiring extremely high bandwidth hardware
Solution Approach 2:
The patent employs periodic action by utilizing one period of the pulse signal to complete N groups of sampling. The signal delay module generates N excitation signals with preset delays within one period, allowing the system to perform multiple sampling operations periodically, thereby achieving high equivalent sampling bandwidth through time-domain multiplexing rather than requiring high-frequency hardware
2Measurement precision
If the rising time of the pulse signal source is reduced to improve time resolution, then the time resolution of TDR is improved, but it becomes more difficult to design and implement
Solution Approach 1:
The signal delay module acts as an intermediary that creates controlled time delays between the excitation signals and the sampling operations. Instead of requiring the pulse signal source to generate extremely fast rising edges, the delay module mediates the timing by introducing precise delays, making the system easier to manufacture while achieving the same time resolution effect
Solution Approach 2:
The patent changes the timing parameters by introducing N different delay times within one period of the pulse signal. Rather than pushing the pulse signal source to operate at extremely fast rising times, the system adjusts the sampling timing parameters through the delay module, achieving high time resolution through parameter optimization rather than extreme hardware specifications
3Measurement precision
If conventional methods are used to improve time resolution, then measurement precision is improved, but the implementation cost becomes high
Solution Approach 1:
The sampling module serves multiple functions: it captures both the sampling incident signal and the test output signal through the coupler, and it performs N groups of sampling operations within one period. This multi-functionality reduces the need for separate expensive high-bandwidth equipment, achieving high time resolution at lower cost by making the sampling system do more with less
Solution Approach 2:
The system creates N copies of the sampling process within one period by using the signal delay module to generate N excitation signals with different delays. Instead of requiring one extremely fast sampling system, the patent uses multiple slower sampling operations copied across different time delays, achieving the same effective resolution at lower cost
Data Source
AI summary
Provided is an electrical signal sampling device. The electrical signal sampling device includes a pulse signal source, a first sampling module, and a signal delay module. The pulse signal source is configured to generate a pulse signal. The first sampling module is connected to the pulse signal source through a coupler. The coupler is configured to fan-out the pulse signal to generate a test input signal and a sampling incidence signal. The test input signal is input into a tested device from the coupler and then is coupled to form a test output signal. The first sampling module is configured to collect the sampling incidence signal and the test output signal through the coupler. The signal delay module generates N excitation signals through a preset delay.