Pulse Test Circuit for Accurate Narrow Pulse Width Measurement
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Solution Overview
Problem
Existing test circuits are unable to accurately measure the narrowing pulse width required for high-speed memory operations, which is essential for ensuring the reliability of pulse signals in memory devices.
Innovation Solution
A test circuit comprising a signal processing module and a sampling module, where the signal processing module generates a processing signal that is either the pulse signal or its inverted version in time division, allowing the sampling module to sample at different edges of the pulse signal with a simpler structure, thereby accurately measuring the pulse width.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the pulse width is narrowed to increase transmission frequency for high-speed memory operations, then the read and write speed is improved, but the measurement precision of the test circuit deteriorates
Solution Approach 1:
The test circuit dynamically adjusts the sampling clock frequency to match the pulse signal frequency being tested. The sampling module uses a controllable sampling clock that can be tuned to synchronize with the narrowing pulse width, enabling accurate measurement even as pulse widths decrease for higher speed operations.
Solution Approach 2:
The invention changes the sampling parameters (sampling clock frequency and phase) to adapt to different pulse width conditions. By adjusting the sampling clock frequency to be equal to or a multiple of the pulse signal frequency, and controlling the phase difference between sampling clocks, the system maintains measurement precision across varying pulse widths.
2Measurement precision
If a complex test circuit structure is used to improve measurement precision for narrowing pulse widths, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The sampling module is designed with multi-functionality, using a single controllable sampling clock that can operate at different frequencies and phases to test various pulse signal conditions. This universal approach eliminates the need for multiple dedicated sampling circuits for different pulse widths, reducing overall device complexity while maintaining measurement precision.
Solution Approach 2:
The test circuit uses periodic sampling clocks with frequencies equal to or multiples of the pulse signal frequency. This periodic action allows the system to capture pulse width information at optimal intervals, achieving high measurement precision through timing-based sampling rather than through complex circuitry.
Data Source
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AI summary
The embodiments of the present application relate to a test circuit, a test device and a test method thereof. The test circuit includes: a signal processing module configured to receive a pulse signal to be tested and output a processing signal under a control signal; a sampling module connected to the output terminal of signal processing module and configured to receive the processing signal and generate a sampling signal according to the processing signal. The sampling signal includes a first sampling pulse and a second sampling pulse, the first sampling pulse and the second sampling pulse have a pulse width difference, the pulse width difference is equal to the pulse width of the pulse signal.