Pulse Test Circuit Using Differential Sampling for Narrow Width Measurement
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Solution Overview
Problem
Current test circuits are unable to accurately measure narrowing pulse widths, which are necessary for improving memory read and write speed, due to increased requirements for pulse signal transmission frequency and reduced pulse width.
Innovation Solution
A test circuit comprising a signal processing module and a sampling module that generates a sampling signal with a pulse width difference, allowing for accurate measurement of pulse width by inverting the pulse signal in time division, simplifying the sampling module's structure and improving test accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the pulse width is reduced to increase transmission frequency for faster memory read and write operations, then the speed increases, but the measurement accuracy of the pulse width deteriorates
Solution Approach 1:
The patent segments the pulse signal measurement process into multiple sampling points. Instead of measuring the entire pulse width directly, the circuit samples the pulse at multiple discrete time points and uses these segmented measurements to calculate the pulse width, thereby improving measurement accuracy for narrow pulses
Solution Approach 2:
The patent introduces an intermediary measurement approach by using a sampling module that generates sampling signals to intercept and measure the pulse signal at specific moments. This intermediary sampling mechanism allows accurate measurement of narrow pulses without directly measuring the entire pulse width
2Measurement precision
If conventional test circuits are used to measure narrow pulse widths, then the device structure remains simple, but the measurement accuracy deteriorates
Solution Approach 1:
The patent employs dynamic sampling where the sampling module generates sampling signals at different time points based on the pulse signal characteristics. This dynamic approach allows the circuit to adapt to varying pulse widths and maintain high measurement accuracy without requiring overly complex fixed-structure circuits
Solution Approach 2:
The patent transitions from direct time-domain measurement to a multi-dimensional measurement approach by sampling at multiple time points and using mathematical relationships between these samples to determine pulse width, effectively adding a temporal dimensionality to the measurement process
Data Source
AI summary
Provided are a test circuit, a test device and a test method thereof. The test circuit includes: a signal processing module configured to receive a pulse signal to be tested and output a processing signal under a control signal; a sampling module connected to the output terminal of signal processing module and configured to receive the processing signal and generate a sampling signal according to the processing signal. The sampling signal includes a first sampling pulse and a second sampling pulse, the first sampling pulse and the second sampling pulse have a pulse width difference, the pulse width difference is equal to the pulse width of the pulse signal.