Semiconductor Pump Data Mediation for Real-Time Pressure Control

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Semiconductor fabrication tools face challenges due to the high loading on engineers from the large quantity and wide distribution of process parameters, often leading to manual recording errors and uncontrollable mis-operation factors.

Innovation Solution

A semiconductor fabrication system that includes a cluster tool, auxiliary apparatuses, a box device, and a display device, where the box device receives and decodes operation data from various apparatuses in different digital protocol formats, displaying it in real-time and sending alerts for out-of-control parameters, and automatically communicating with the apparatuses to adjust operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual recording of process parameters is used, then flexibility in operation is maintained, but error rate increases and reliability decreases

Engineering Contradiction:
Improveaccuracy of parameter recordingVSAvoidcomplexity of parameter management system
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system enables self-service automation where the fabrication tool automatically records, transmits, and manages its own process parameters through integrated sensors and communication modules, eliminating manual recording errors while maintaining operational flexibility

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Manual mechanical recording processes are replaced with automated electronic data acquisition and transmission systems, substituting human operators with sensor-based automatic monitoring that continuously captures and reports parameter values

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If automated data collection system is implemented, then reliability improves, but device complexity increases

Engineering Contradiction:
Improvecontrol over process parametersVSAvoidnumber of sensors and data management components
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The fabrication tool is designed with multi-functional capabilities where sensors serve multiple purposes: monitoring process parameters, detecting anomalies, and providing feedback for automatic control adjustments, thereby managing complexity through consolidated functionality

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

A centralized data management system acts as an intermediary that receives data from multiple sensors, processes information, and coordinates control actions, simplifying the overall system architecture by creating a single point of integration rather than distributed complex connections

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If real-time monitoring and automatic adjustment system is used, then productivity improves, but device complexity increases

Engineering Contradiction:
Improvefabrication process efficiencyVSAvoidautomation system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The system implements continuous feedback loops where sensors monitor process parameters in real-time, compare actual values with target specifications, and automatically adjust process conditions through control modules, enabling self-correcting operation that improves productivity without requiring complex external intervention systems

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The fabrication tool performs self-adjustment of process parameters based on real-time sensor data and pre-programmed control algorithms, autonomously maintaining optimal operating conditions without external manual intervention, thereby improving productivity while keeping the control system manageable

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS20240241495A1System and method for semiconductor fabricating process
Publication Date: 2024.07.18 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240241495A1 patent drawing
  • US20240241495A1 patent drawing
  • US20240241495A1 patent drawing

AI summary

A method includes using a first pump apparatus to control a pressure condition of a first chamber, wherein the first pump apparatus produces a first operation data in a first digital protocol format; using a second pump apparatus to control a pressure condition of a second chamber, wherein the second pump apparatus produces a second operation data in a second digital protocol format different from the first digital protocol format; receiving, by a box device, the first operation data in the first digital protocol format and the second operation data in the second digital protocol format; decoding, by the box device, the first operation data in the first digital protocol format and the second operation data in the second digital protocol format; determining whether the first operation data is in an acceptable range; and adjusting the first pump apparatus to set the first operation data within the acceptable range.