Pupil Imaging for Light Source Emission Characterization
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Solution Overview
Problem
Existing methods for characterizing the emission characteristics of light sources and samples, such as goniometric techniques, require bulky and expensive devices, making them costly and complex, and are difficult to integrate into existing analyzer setups.
Innovation Solution
The method employs pupil imaging techniques using imaging optics to generate a pupil of the light source or sample, allowing for characterization of spatial and angular emission properties with simple mechanical components, such as a translational actuator, and can be integrated into existing analyzers without significant redesign.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If goniometric techniques are used to characterize light sources, then angular emission properties can be measured, but the device becomes bulky and expensive
Solution Approach 1:
The patent replaces the mechanical goniometric system with an optical pupil imaging system. Instead of physically moving detectors around the light source, the invention uses imaging optics to capture angular emission information through pupil images, eliminating complex mechanical arrangements while maintaining measurement capability
Solution Approach 2:
The patent creates optical copies (pupil images) of the angular emission information. By imaging the pupil plane onto a detector, the system captures angular distribution data without physical movement, effectively copying the angular information into a static image that can be analyzed
2Measurement precision
If goniometric techniques are used to characterize light sources, then spatial distribution can be measured, but the device size increases
Solution Approach 1:
The patent replaces mechanical scanning systems with optical imaging. The imaging optics directly capture spatial distribution information through pupil images on a stationary detector, eliminating the need for large mechanical scanning apparatus while maintaining measurement precision
Solution Approach 2:
The patent transforms the measurement approach by adding an optical dimension. Instead of mechanical movement in physical space, the system uses optical path differences and pupil plane imaging to encode spatial and angular information, effectively measuring multiple parameters simultaneously through optical field manipulation
3Measurement precision
If goniometric techniques are used, then emission characteristics can be characterized, but the cost increases
Solution Approach 1:
The patent employs simpler, more cost-effective optical components instead of expensive goniometric mechanisms. The system uses standard imaging optics and stationary detectors that are cheaper to manufacture and maintain, while still providing comprehensive emission characterization
Solution Approach 2:
The patent creates a multi-functional system where the imaging optics serve multiple purposes: characterizing angular emission, spatial distribution, and intensity profiles all through the same optical path and detector setup, eliminating the need for separate specialized instruments
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach provides a cost-effective and compact method for characterizing light sources and samples, offering additional information on angular emission properties and enabling integration into existing analyzer setups without excessive complexity or cost.
Implementation Method 1
employing pupil imaging techniques to characterize light sources or samples
Implementation Method 2
collecting light emitted from the light source by using imaging optics, the imaging optics generating a pupil of the collected light
Data Source
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AI summary
In one aspect, the present disclosure relates to a method for characterizing a light source, the method including providing a light source to be characterized, collecting light emitted from the light source by using imaging optics, the imaging optics generating a pupil of the collected light emitted from the light source, generating an image of a pupil of light emitted only from a first surface area of the light source at a detector using the imaging optics, laterally shifting the light source and the imaging optics relative to each other and after the lateral shift, generating an image of a pupil of light emitted only from a second surface area of the light source at the detector using the imaging optics, wherein the imaging optics includes a field stop between the light source and the detector to select a portion of the light source's surface from which light is imaged at a time.