PV String Curve Scanning for Light-Change Detection

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Solution Overview

Problem

Existing photovoltaic power generation systems face challenges in accurately determining the integrity and power generation capability of photovoltaic strings due to the influence of light changes during IV curve scanning, leading to unreliable results.

Innovation Solution

A parametric curve scanning method is employed, involving separate voltage range scans with overlapping endpoints to compare current parameters at the same voltage points, allowing for the detection of light-induced changes and ensuring the validity of the scanned curves without additional hardware.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If IV curve scanning is performed on the photovoltaic string to detect defects and determine power generation capability, then measurement information is obtained, but light changes during scanning cause the IV curve to inaccurately reflect the photovoltaic string's output features

Engineering Contradiction:
Improveaccuracy of IV curve detectionVSAvoidreliability of curve scanning results
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent performs IV curve scanning twice: first in a normal state to obtain an initial IV curve, and then after a light change to obtain a second IV curve. By periodically repeating the scanning process under different lighting conditions, the system can compare the two curves to determine whether light changes have affected the photovoltaic string's performance, thereby improving measurement reliability

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The system uses the comparison result between the first and second IV curves as feedback to determine whether the photovoltaic string is defective. If the curves differ beyond a threshold, it indicates a defect; otherwise, the string is functioning normally. This feedback mechanism enables accurate defect detection while accounting for light changes

Inventive Principle:
Principle #23Feedback

2Reliability

If additional hardware devices are added to improve scanning reliability, then measurement accuracy improves, but device complexity and costs increase

Engineering Contradiction:
Improvescanning reliabilityVSAvoidhardware requirements
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system uses its existing scanning capability to perform self-diagnosis by comparing IV curves obtained under different lighting conditions. No external reference equipment or additional sensors are needed - the photovoltaic string scans itself twice and the controller compares the results. This self-service approach improves reliability without increasing hardware complexity

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent creates a copy of the IV curve measurement process by performing the scan twice - once before light change and once after. This temporal copy allows comparison to detect light-induced variations without requiring parallel measurement systems or additional hardware, maintaining simplicity while improving reliability

Inventive Principle:
Principle #26Copying

Data Source

PatentEP4258505B1Parameter curve scanning method for photovoltaic string, converter, and photovoltaic power generation system
Publication Date: 2025.09.03 HUAWEI DIGITAL POWER TECH CO LTD
  • EP4258505B1 patent drawingFigure 1
  • EP4258505B1 patent drawingFigure 2
  • EP4258505B1 patent drawingFigure 3~4

AI summary

This application relates to a converter in a photovoltaic power generation system and a parametric curve scanning method for a photovoltaic string. A parametric curve includes a current-voltage curve or a power-voltage curve. The scanning method includes: controlling an output voltage of the photovoltaic string to change from a first endpoint voltage of a first voltage range to a second endpoint voltage of the first voltage range according to a first preset rule, to scan a first parametric curve; controlling the output voltage of the photovoltaic string to change from a third endpoint voltage of a second voltage range to a fourth endpoint voltage of the second voltage range according to a second preset rule, to scan a second parametric curve. There is an intersection set between the first voltage range and the second voltage range. In this application, whether a scanned curve is affected by a light change may be determined based on the first parametric curve and the second parametric curve. This is convenient and fast, and no additional hardware test device is required.