Hierarchical Quality Control for Defect Cause Traceability

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Solution Overview

Problem

In complex products composed of multiple components, identifying the specific element causing a quality defect is challenging due to the lack of effective tools that integrate test values, assembling management information, and step-related data to pinpoint defect causes.

Innovation Solution

A quality control apparatus that acquires and integrates test values, assembling management information, and step-related information to display a hierarchical configuration diagram, highlighting combinations of components and production steps likely causing defects based on deviation analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If test values, assembling management information, and step-related information are integrated and analyzed, then defect cause identification accuracy is improved, but system complexity increases

Engineering Contradiction:
Improvedefect cause identification accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system segments the complex quality control task into three distinct information acquisition units: test value acquisition unit, assembling management information acquisition unit, and step-related information acquisition unit. Each unit independently collects specific types of data, which are then integrated by the defect cause identification unit. This segmentation reduces system complexity by organizing functions into modular, manageable components while maintaining comprehensive defect analysis capability.

Inventive Principle:
Principle #1Segmentation

2Reliability

If comprehensive data integration is performed to identify defect causes, then quality control effectiveness is improved, but information processing time increases

Engineering Contradiction:
Improvequality control effectivenessVSAvoidinformation processing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system performs preliminary actions by pre-collecting and organizing test values, assembling management information, and step-related information into structured databases before defect analysis is needed. The information acquisition units continuously gather and store data in readiness, so when a defect occurs, the defect cause identification unit can immediately query and analyze the pre-organized information without time-consuming data collection, thus maintaining high quality control effectiveness while minimizing processing time.

Inventive Principle:
Principle #10Preliminary action

3Loss of information

If hierarchical configuration diagram with defect paths is displayed, then defect visualization is improved, but data processing complexity increases

Engineering Contradiction:
Improvedefect visualizationVSAvoiddata processing complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The system transforms complex defect data relationships into a visual hierarchical configuration diagram that adds a spatial dimension to defect analysis. The display unit presents product configuration hierarchies with overlaid defect paths, allowing operators to visually trace defect propagation through assembly levels. This dimensional transformation converts complex tabular data relationships into intuitive graphical representations, improving defect visualization while the automated path generation algorithm handles the processing complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11106198B2Quality control apparatus
Publication Date: 2021.08.31 FUJIFILM BUSINESS INNOVATION CORP
  • US11106198B2 patent drawing
  • US11106198B2 patent drawing
  • US11106198B2 patent drawing

AI summary

A quality control apparatus includes: a test value acquisition unit that acquires test values of respective components that constitute a product; an assembling management information acquisition unit that acquires assembling management information that is information concerning assembling of the product and the components; a step-related information acquisition unit that acquires step-related information that is information related to a production step; and a display that displays a configuration diagram of the product that is hierarchically constituted by the components and shows a combination of elements that are assumed to be likely to have caused a quality defect of the product on the configuration diagram on a basis of the test values, the assembling management information, and the step-related information.