Quality-Indexed Scanning for Rewritable Memory Maintenance
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Solution Overview
Problem
The frequent execution of full-disc scanning in rewritable non-volatile memory modules leads to resource wastage and potential reduction in module lifetime, while infrequent scanning may result in missed optimal maintenance times, affecting data integrity.
Innovation Solution
A memory management method that involves obtaining quality estimation parameters for physical units, establishing a check list with index information for units with poor data storage quality, and performing status scanning only on these selected units based on predefined conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If full-disc scanning is performed frequently to ensure memory module health, then data integrity is improved, but system resources are wasted and module lifetime is shortened
Solution Approach 1:
The patent applies local quality by performing scanning operations selectively on specific physical units rather than uniformly across the entire memory module. The controller identifies physical units with deteriorating quality (high bit error rate) and performs scanning only on those units, thereby concentrating resources where they are most needed while preserving resources in healthy units.
Solution Approach 2:
The patent implements partial action by performing scanning operations on only a subset of physical units (those meeting the bit error rate threshold) rather than executing full-disc scanning on all units. This partial scanning approach maintains data integrity for at-risk units while avoiding unnecessary resource consumption on healthy units.
2Reliability
If full-disc scanning is performed frequently to ensure memory module health, then data integrity is improved, but module lifetime is shortened
Solution Approach 1:
The patent extends module lifetime by applying local quality principles to scanning operations. Instead of uniformly scanning all physical units which accelerates wear, the controller selectively scans only those units exhibiting deteriorating characteristics (bit error rate ≥ threshold). This localized approach maintains data integrity while reducing cumulative wear on the memory module.
Solution Approach 2:
The patent preserves module lifetime through partial scanning actions. By performing scanning operations on only the necessary subset of physical units (those with high bit error rates) rather than all units, the patent reduces the total number of program/erase cycles and scanning operations, thereby extending the operational lifetime of the memory module.
3Loss of energy
If full-disc scanning is performed infrequently to save resources, then system resources are preserved, but optimal maintenance timing is missed
Solution Approach 1:
The patent implements preliminary action by continuously monitoring the bit error rate of physical units and maintaining a check list of units approaching failure thresholds. This advance identification allows the controller to perform scanning operations proactively on at-risk units before actual failures occur, ensuring data integrity while avoiding resource waste on healthy units.
Solution Approach 2:
The patent applies feedback mechanisms by continuously monitoring bit error rates and using this information to dynamically adjust scanning operations. The controller receives feedback on physical unit quality, updates the check list accordingly, and performs scanning only on units that require attention. This feedback-driven approach ensures optimal maintenance timing while conserving system resources.
4Productivity
If selective scanning based on quality estimation is implemented, then maintenance efficiency is improved, but device complexity increases
Solution Approach 1:
The patent improves maintenance efficiency through preliminary actions of estimating quality parameters and pre-populating a check list with physical units that require scanning. By performing these preparatory steps before actual scanning operations, the controller can efficiently target only necessary units, significantly improving maintenance productivity compared to exhaustive full-disc scanning.
Data Source
AI summary
The present disclosure provides a memory management method, a memory storage apparatus and a memory control circuit unit. The method includes: performing a first operation on a plurality of physical units to obtain a quality estimation parameter corresponding to the physical units; establishing a check list according to the quality estimation parameter, wherein the check list records index information of a first physical unit among the physical units, and a number of the first physical unit is less than a total number of the physical units; and in response to a default condition being satisfied, performing a status scanning on the first physical unit according to the index information in the check list.