Quantum Dot Device Hole Injection Layer Energy Level Gradient

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Quantum dot devices face challenges in achieving improved performance due to their differences from conventional light emitting elements, requiring a new method to enhance their efficiency and effectiveness.

Innovation Solution

A quantum dot device structure is developed, including a specific configuration of layers such as an anode, hole injection layer, hole transport layer, and cathode, with tailored energy levels and materials like cadmium-free quantum dots with a core-shell structure, and a hole injection layer composed of conductive and insulating polymers to optimize energy levels and hole mobility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If quantum dots are used as light emitting elements, then wavelength control is improved, but device performance is insufficient

Engineering Contradiction:
Improvewavelength controlVSAvoiddevice performance
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent changes the energy level parameters of the hole injection layer and quantum dot layer to achieve optimal performance. Specifically, the HOMO energy level of the quantum dot layer is set to 5.6 eV or higher, and the HOMO energy level difference between the hole transport layer and quantum dot layer is controlled to be less than 0.5 eV, resolving the performance issue while maintaining wavelength control

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material structures including core-shell quantum dots and multi-layer organic layers with specific HOMO energy levels. The hole injection layer comprises multiple compounds with different HOMO levels (5.0-5.5 eV and 5.5-7.0 eV) to create an optimized energy level gradient that improves device performance

Inventive Principle:
Principle #40Composite materials

2Speed

If HOMO energy level of quantum dot layer is increased to 5.6 eV or higher, then hole mobility is improved, but energy level matching complexity increases

Engineering Contradiction:
Improvehole mobilityVSAvoidenergy level matching
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The patent systematically adjusts the HOMO energy level parameters across different layers. The hole injection layer uses compounds with HOMO levels of 5.0-5.5 eV, the hole transport layer has HOMO level of 5.5-7.0 eV, and the quantum dot layer has HOMO level of 5.6 eV or higher. This parameter optimization improves hole mobility while the energy level differences are controlled to remain less than 0.5 eV to manage complexity

Inventive Principle:
Principle #35Parameter changes

3Productivity

If hole injection layer composition is optimized with conductive and insulating polymers, then device efficiency is improved, but manufacturing complexity increases

Engineering Contradiction:
Improvedevice efficiencyVSAvoidmanufacturing complexity
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The hole injection layer is constructed as a composite material system combining conductive polymers (first compound with HOMO 5.0-5.5 eV) and insulating polymers (second compound with HOMO 5.5-7.0 eV). The weight ratio of second to first compound ranges from 1:1.1 to 1:10, creating optimal charge transport properties that improve device efficiency

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent applies different material compositions at different locations within the hole injection layer. The first compound dominates near the anode interface for efficient hole injection, while the second compound becomes more prevalent toward the quantum dot layer for energy level matching, with the weight ratio varying spatially to optimize local properties

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The proposed configuration enhances the performance of quantum dot devices by improving hole mobility and reducing energy barriers, leading to increased efficiency and extended lifespan.

Implementation Method 1

semiconductor nanocrystal particles (also known as quantum dots) may be supplied with photoenergy or electrical energy and may emit light in a wavelength corresponding to sizes of the quantum dots

Methodology Applied
Scientific EffectQuantum confinement effect:

Implementation Method 2

a hole injection layer disposed on the anode, a hole transport layer disposed on the hole injection layer

Methodology Applied
Scientific EffectHole transport:

Implementation Method 3

quantum dots each having a core-shell structure including a core part and a shell part that protects the core part

Methodology Applied
Scientific EffectCore-shell structure protection:

Data Source

PatentEP3490020B1Quantum dot device and electronic device
Publication Date: 2021.01.13 SAMSUNG ELECTRONICS CO LTD
  • EP3490020B1 patent drawing
  • EP3490020B1 patent drawing
  • EP3490020B1 patent drawing

AI summary

A quantum dot device includes an anode, a hole injection layer on the anode, a hole transport layer on the hole injection layer, a quantum dot layer on the hole transport layer, and a cathode on the quantum dot layer, wherein a highest occupied molecule orbital (HOMO) energy level of the quantum dot layer is greater than or equal to about 5.6 electronvolts (eV), a difference between a HOMO energy level of the hole transport layer and the highest occupied molecule orbital energy level of the quantum dot layer is less than about 0.5 eV, the hole injection layer has a first surface contacting the anode and a second surface contacting the hole transport layer, and a HOMO energy level of the first surface of the hole injection layer is different from a HOMO energy level of the second surface of the hole injection layer.