Quantum Memory Structure for Metrology Coherence

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Solution Overview

Problem

Traditional memory devices have a coherence time window that is less than that of quantum systems, making them incompatible with emerging quantum metrology operations and limiting the ability to store quantum-related data prior to decoherence.

Innovation Solution

The implementation of novel quantum memory structures with a coherence time window greater than the quantum system, coupled with a data processing unit (DPU) to generate and process quantum data packets, enabling efficient quantum metrology operations during the coherence time window.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional memory devices are used to store quantum data, then device compatibility and ease of manufacture are improved, but the coherence time window is insufficient leading to data loss before decoherence

Engineering Contradiction:
Improvecoherence time windowVSAvoiddevice compatibility
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent changes the fundamental parameter of coherence time by transitioning from traditional memory devices to quantum memory structures. These quantum memory structures are specifically designed to maintain quantum states with coherence times exceeding those of the quantum systems they serve, thereby resolving the reliability issue without requiring compromise on device compatibility since the quantum memory structures are integrated into the quantum device architecture

Inventive Principle:
Principle #35Parameter changes

2Reliability

If quantum memory structures with longer coherence time are implemented, then reliability for quantum metrology is improved, but device complexity increases

Engineering Contradiction:
Improvecoherence time windowVSAvoidquantum memory structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the quantum device into distinct functional modules: quantum measurement modules for performing measurements, quantum memory structures for storing quantum data with extended coherence times, and data processing units for generating data packets. This segmentation allows each component to be optimized independently, managing overall device complexity while achieving the reliability benefits of extended coherence time through specialized memory structures

Inventive Principle:
Principle #1Segmentation

3Productivity

If quantum data is processed locally by DPU, then productivity and speed are improved, but loss of time for data transmission occurs

Engineering Contradiction:
Improvedata processing speedVSAvoiddata transmission time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The patent implements preliminary action by performing data processing locally at the quantum device through integrated data processing units (DPUs) rather than transmitting raw quantum data externally for processing. This local processing occurs immediately when the quantum measurement modules generate quantum data, eliminating transmission delays and ensuring that data packets are prepared and transmitted only when complete, thereby maximizing productivity while minimizing transmission time loss

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20240354617A1Quantum devices and memory structures for quantum metrology
Publication Date: 2024.10.24 MELLANOX TECHNOLOGIES LTD(IL)
  • US20240354617A1 patent drawing
  • US20240354617A1 patent drawing
  • US20240354617A1 patent drawing

AI summary

Quantum systems, devices, and methods are described herein that enable quantum metrology. An example quantum device includes a first quantum measurement module operably coupled with a first quantum system. The first quantum measurement module applies one or more measurements to the first quantum system and obtains first information associated with the first quantum system based on the one or more measurements. The quantum device further includes a first quantum memory structure operably coupled with the first quantum measurement module. A coherence time window associated with the first quantum memory structure is greater than a coherence time window time associated with the first quantum system. The quantum devices and associated memory structures provide a new methodology for a quantum metrology system.