Quantum Sensor System for Contactless PCB Testing
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Solution Overview
Problem
Current testing methods for electronic devices, such as printed circuit boards (PCBs), are slow and require physical connection to a test rig, making them inefficient and prone to production delays, especially when analyzing electromagnetic radiation emissions.
Innovation Solution
A quantum sensor system that uses an optically excitable medium, light sources, and field generators to modify resonance frequencies, allowing for contactless analysis of electromagnetic radiation emissions by acquiring and analyzing intensity profiles with a processor, enabling efficient evaluation of device functionality, including phase and frequency analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a wire connection to a test rig is used for testing, then device functionality can be tested, but the testing process becomes slow and requires additional equipment
Solution Approach 1:
The patent replaces the mechanical wire connection system with an electromagnetic field-based measurement system. An optically excitable medium (such as a Rydberg atom gas) is used to detect electromagnetic radiation emitted by the DUT without physical contact. This substitution eliminates the need for wire connections and manual setup, enabling automated, high-speed testing while maintaining measurement accuracy through quantum-enhanced electromagnetic field detection.
2Reliability
If wire connection and disconnection is required for each PCB, then device testing can be performed, but production delays occur
Solution Approach 1:
The system replaces mechanical connection/disconnection operations with contactless electromagnetic measurement. The optically excitable medium detects EM radiation from the DUT through optical excitation and fluorescence measurement, eliminating all wire manipulation steps. This enables automated testing on assembly lines without manual intervention, directly addressing production time losses.
Solution Approach 2:
The testing system is designed to automatically detect and measure EM radiation emissions from the DUT without requiring external wire connections. The optically excitable medium self-excites through optical pumping and automatically responds to the DUT's electromagnetic emissions, enabling autonomous, high-speed measurement that integrates seamlessly into production workflows.
3Measurement precision
If traditional measurement schemes are used for electromagnetic radiation analysis, then radiation can be detected, but the process is slow and requires physical contact
Solution Approach 1:
The patent replaces traditional wired electromagnetic measurement equipment with a contactless optical measurement system. The optically excitable medium (Rydberg atom gas) is excited by lasers and detects EM radiation through quantum-state transitions, which are then read out optically via fluorescence detection. This eliminates all mechanical connections while achieving high measurement precision through quantum-enhanced sensitivity.
Solution Approach 2:
The system changes the measurement parameter from direct electrical signal detection to optical fluorescence intensity measurement. By optically exciting the Rydberg atoms and detecting changes in their fluorescence signal in response to EM radiation, the system achieves high-precision measurement without physical contact, greatly improving ease of operation and integration into production environments.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid, contactless testing of electronic devices, allowing for the detection of faulty PCBs that emit radiation at incorrect frequencies or from incorrect locations, thereby improving production efficiency and reducing delays.
Implementation Method 1
an optically excitable medium which is arranged to receive electromagnetic (EM) radiation emitted by the DUT, at least one light source configured to irradiate the medium with at least one light beam, wherein the medium is optically excited by the at least one light beam
Implementation Method 2
a field generator unit configured to generate an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field
Implementation Method 3
an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium
Implementation Method 4
an optical parameter, in particular a luminescence, of the exited medium is locally modified
Implementation Method 5
an image detector configured to acquire an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter
Data Source
AI summary
The invention relates to a system in particular a quantum sensor system, for testing a device-under-test, DUT, comprising: an optically excitable medium which is arranged to receive electromagnetic, EM, radiation emitted by the DUT, at least one light source configured to irradiate the medium with at least one light beam, wherein the medium is optically excited by the at least one light beam, a field generator unit configured to generate an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field, wherein an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium, an image detector configured to acquire an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter, a processor configured to analyze the DUT based on the acquired image.