Ultra-Thin Quartz Resonator Fabrication for High Q Chip Integration

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Solution Overview

Problem

Current quartz fabrication techniques fail to produce ultra-thin resonators with high Q values and integrated capabilities on a chip, limiting their application in high-frequency devices due to size and cost constraints, and inability to achieve thicknesses below 10 micrometers with real-time thickness monitoring.

Innovation Solution

A method involving a handle substrate, interposer film, and host substrate to thin and bond quartz substrates, allowing for precise thickness control and integration with other electronics, using techniques like mechanical lapping, polishing, and reactive ion etching for achieving thicknesses below 10 micrometers while maintaining high Q values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If present quartz fabrication techniques are used, then resonators can be manufactured, but they cannot be integrated on a chip with other electronics, resulting in increased device size and cost

Engineering Contradiction:
Improveintegration capabilityVSAvoiddevice size
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

The patent combines the quartz resonator fabrication process with standard semiconductor manufacturing processes, allowing the resonator to be integrated directly on the chip with other electronics. This merging of previously separate processes enables monolithic integration, reducing device size and eliminating the need for separate discrete components.

Inventive Principle:
Principle #5Merging (Combining)

2Speed

If quartz substrate thickness is reduced to increase resonant frequency, then higher resonant frequencies are achieved, but the surface smoothness and Q value deteriorate due to surface damage

Engineering Contradiction:
Improveresonant frequencyVSAvoidQ value
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent replaces traditional mechanical surface preparation methods (lapping and polishing) with chemical-mechanical polishing (CMP) and selective etching processes. These chemical-based approaches remove surface damage layers more effectively while maintaining surface smoothness, allowing ultra-thin substrates to achieve both high resonant frequencies and high Q values.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the substrate thickness parameter to ultra-thin dimensions (below 10 micrometers) while simultaneously optimizing other parameters such as surface treatment methods and bonding processes. This coordinated parameter optimization enables the substrate to maintain structural integrity and surface quality at reduced thickness, achieving high resonant frequencies without sacrificing Q value.

Inventive Principle:
Principle #35Parameter changes

3Speed

If quartz substrate thickness is reduced below 10 micrometers, then resonant frequencies greater than 100 MHz are achieved, but real-time thickness monitoring becomes impossible with sub micron resolution

Engineering Contradiction:
Improveresonant frequencyVSAvoidthickness monitoring capability
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent implements real-time feedback control during the substrate thinning process using advanced measurement techniques such as interferometry or ellipsometry, which can measure thickness changes at the nanometer scale. This feedback system continuously monitors the substrate thickness and adjusts the etching rate accordingly, enabling precise control of ultra-thin substrates below 10 micrometers without losing measurement capability.

Inventive Principle:
Principle #23Feedback

4Adaptability or versatility

If conventional capacitive-based filters are used to cover low frequency bands, then filter functionality is achieved, but device size increases significantly

Engineering Contradiction:
Improvefrequency coverageVSAvoiddevice size
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

The patent creates a universal resonator platform that can operate across a broad frequency range by adjusting the quartz substrate thickness and resonator geometry. This multi-functional resonator design replaces the need for different filter types (capacitive for low frequency, other types for high frequency) with a single resonator technology that can be tuned to cover the entire spectrum, significantly reducing device size.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the fabrication of high-frequency quartz resonators with Q values of 10,000, suitable for frequency hopping and filter reconfiguration, reducing device size and cost by integrating resonators with other electronics on a chip.

Implementation Method 1

bonding the quartz substrate to the handle substrate wherein the interposer film is disposed between the quartz substrate and the handle substrate

Methodology Applied
Scientific EffectAdhesion: Adhesive

Implementation Method 2

using techniques like mechanical lapping, polishing

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 3

reactive ion etching for achieving thicknesses below 10 micrometers

Methodology Applied
Scientific EffectReactive ion etching: Plasma

Data Source

PatentUS7802356B1Method of fabricating an ultra thin quartz resonator component
Publication Date: 2010.09.28 HRL LAB
  • US7802356B1 patent drawing
  • US7802356B1 patent drawing
  • US7802356B1 patent drawing

AI summary

A method for manufacturing a resonator is presented in the present application. The method includes providing a handle substrate, providing a host substrate, providing a quartz substrate comprising a first surface opposite a second surface, applying interposer film to the first surface of the quartz substrate, bonding the quartz substrate to the handle substrate wherein the interposer film is disposed between the quartz substrate and the handle substrate, thinning the second surface of the quartz substrate, removing a portion of the bonded quartz substrate to expose a portion of the interposer film, bonding the quartz substrate to the host substrate, and removing the handle substrate and the interposer film, thereby releasing the quartz substrate.