Contactless Qubit Screening via Microwave Probe Coupling
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Solution Overview
Problem
Existing qubit screening technologies lack a non-invasive, contactless approach to extract qubit parameters such as frequency and energy relaxation time prior to packaging or while in a cryostat, leading to uncertainty and inefficiency in obtaining fully functional quantum processors.
Innovation Solution
A system comprising a memory, processor, scanner component, and parameter extraction component that establishes a direct microwave coupling with a scanning probe device to a qubit, allowing for contactless determination of qubit frequency and energy relaxation time using capacitive or inductive coupling and microwave spectroscopy techniques.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If contactless microwave coupling is established to extract qubit parameters, then measurement precision and non-invasiveness are improved, but device complexity increases due to the need for scanning probe devices and microwave spectroscopy systems
Solution Approach 1:
A scanning probe device is introduced as an intermediary between the microwave source and the qubit. The probe establishes capacitive or inductive coupling to the qubit without direct contact, enabling parameter extraction while maintaining a clear separation between the measurement system and the quantum device.
Solution Approach 2:
The patent replaces traditional electrical contact-based measurement methods with microwave spectroscopy through capacitive or inductive coupling. This substitution eliminates the need for direct wire connections to the qubit, enabling contactless parameter extraction.
2Device complexity
If traditional contact-based screening methods are used, then device complexity is reduced, but measurement precision and non-invasiveness deteriorate due to potential qubit disturbance
Solution Approach 1:
The patent replaces traditional electrical contact-based measurement methods with microwave spectroscopy through capacitive or inductive coupling. This substitution eliminates the need for direct wire connections to the qubit, enabling contactless parameter extraction that avoids disturbing the qubit state.
Solution Approach 2:
The scanning probe device serves as a mediator that couples to the qubit through electromagnetic fields rather than direct electrical contact. This intermediary approach allows parameter measurement without the invasive effects of physical connection.
3Productivity
If qubit screening is performed prior to packaging in a cryostat, then productivity is improved by early identification of functional qubits, but device complexity increases due to the need for external probing infrastructure
Solution Approach 1:
The patent enables qubit parameter extraction to be performed before the qubit is packaged into its final quantum processor. By conducting screening operations externally through the scanning probe device, the system identifies functional qubits early in the fabrication process, allowing for selective integration into quantum processors.
Solution Approach 2:
The scanning probe device acts as an external intermediary that provides the necessary coupling infrastructure for pre-packaging screening. This external probing system eliminates the need for complex internal wiring in the quantum device during the screening phase.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient, non-invasive extraction of qubit parameters, reducing the time and complexity of qubit screening, and improving the chances of obtaining frequency collision-free quantum processors.
Implementation Method 1
establishes a direct microwave coupling of a scanning probe device to a qubit of a quantum device
Implementation Method 2
establishes a direct microwave coupling of a scanning probe device to a qubit of a quantum device
Implementation Method 3
determines qubit frequency of the qubit based on the direct microwave coupling
Data Source
AI summary
Systems, devices, computer-implemented methods, and computer program products to facilitate contactless screening of a qubit are provided. According to an embodiment, a system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise a scanner component that establishes a direct microwave coupling of a scanning probe device to a qubit of a quantum device. The computer executable components can further comprise a parameter extraction component that determines qubit frequency of the qubit based on the direct microwave coupling.


