Quick Activate Command Sequences for Memory Testing
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Solution Overview
Problem
The increasing capacity of memory devices has led to longer testing durations, increased current draw, and unintentional disturbances during testing procedures, particularly due to the use of access command sequences that are associated with longer duration operations and unnecessary voltage applications.
Innovation Solution
The implementation of modified Quick ACT and Quick PRE command sequences that omit certain operations, such as precharging digit lines and sensing voltage, to reduce testing duration, current draw, and disturbance, allowing for faster and more efficient testing without affecting the logic states stored in memory cells.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If access command sequences are used for testing memory devices, then the memory device can be tested for reliability, but the testing duration increases and current draw increases
Solution Approach 1:
The patent extracts and removes unnecessary operations from the standard access command sequence, specifically eliminating precharge operations and voltage application steps that are not required for reliability testing. This creates a simplified Quick ACT command sequence that retains the essential testing functionality while removing time-consuming and current-draw-intensive operations.
Solution Approach 2:
The patent applies partial action by performing only the minimum necessary operations for reliability testing. Instead of executing the complete access command sequence with all its steps (including precharge, activate, sense, and write-back), the Quick ACT command performs only the critical activate operation needed to test memory cell accessibility, omitting redundant steps.
2Reliability
If access command sequences are used for testing memory devices, then the memory device can be tested for reliability, but current draw increases
Solution Approach 1:
The patent extracts and removes operations that cause high current draw, specifically the precharge operations that apply voltages to digit lines and the sense operations that activate sense amplifiers. By eliminating these voltage-intensive operations while retaining the core activate function, the Quick ACT command significantly reduces current consumption during testing.
3Reliability
If access command sequences are used for testing memory devices, then the memory device can be tested, but unintentional disturbances occur during testing
Solution Approach 1:
The patent removes operations that generate unintentional disturbances, specifically eliminating the precharge operations that apply voltages to memory cells and the sense operations that read memory cell states. By omitting these operations, the Quick ACT command prevents voltage-induced disturbances and unwanted state changes in memory cells while still testing basic accessibility.
4Loss of time
If modified Quick ACT command sequences are used, then testing duration is reduced, but certain operations such as precharging digit lines and sensing voltage are omitted
Solution Approach 1:
The patent segments the standard access command sequence into distinct operational phases (precharge, activate, sense, write-back) and selectively executes only the essential activate phase for Quick ACT commands. This segmentation allows the system to maintain a library of complete command sequences for full testing while implementing simplified versions for rapid reliability testing when appropriate.
Data Source
AI summary
Methods, systems, and devices for quick activate for memory sensing are described. An operating mode that is associated with a command sequence having a reduced duration relative to another operating mode may be configured at a memory device. The operating mode may be configured based on determining that a testing procedure does not attempt to preserve or is independent of preserving a logic state of accessed memory cells, among other conditions. While operating in the mode, the memory device may perform a received activate command using a first set of operations having a first duration—rather than a second set of operations having a second set of operations having a second, longer duration—to perform the received activate command. The first set of operations may also use less current or introduce less disturbance into the memory device relative to the second set of operations.