Rack Test Room for Data Center Thermal Simulation

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Solution Overview

Problem

Typical thermal chambers lack the ability to simulate the data center environment, specifically maintaining hot and cold aisles and controlling air flow rates and temperatures, making it difficult to assess the effects of hardware design changes on thermal performance.

Innovation Solution

A rack test room is designed to simulate a data center environment by controlling and monitoring environmental parameters such as air flow rate, temperature, and humidity, allowing for detailed thermal testing of server and rack combinations, with instrumentation including sensors and a data acquisition system to record and control these parameters.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If a typical thermal chamber is used for rack-level thermal testing, then uniform temperature and humidity can be maintained, but the ability to maintain hot and cold aisles and control air flow rates is lost

Engineering Contradiction:
Improveuniform temperatureVSAvoidability to simulate data center environment
Core Design Contradiction:
TemperatureVSAdaptability or versatility

Solution Approach 1:

The thermal chamber is segmented into distinct hot and cold aisle zones separated by rack enclosures. This segmentation allows different temperature conditions to be maintained in different spatial regions, enabling realistic data center environment simulation while preserving the chamber's temperature control capabilities

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the thermal chamber are assigned different thermal characteristics - the cold aisle region maintains lower temperatures while the hot aisle region maintains higher temperatures. This local differentiation enables the chamber to simulate real data center conditions where temperature varies by location, rather than maintaining uniform temperature throughout

Inventive Principle:
Principle #3Local quality

2Device complexity

If a typical thermal chamber is used for thermal testing, then simple temperature control is achieved, but detailed monitoring and control of air flow rates and temperatures at rack level is lost

Engineering Contradiction:
Improvesimplicity of chamber operationVSAvoidmonitoring of air flow rate and temperature
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

Multiple sensors are deployed throughout the thermal chamber to continuously monitor temperature and air flow rates at various locations including cold aisle, hot aisle, and individual rack levels. This feedback data is fed back to control systems that adjust cooling mechanisms and air flow to maintain desired conditions, enabling precise measurement and control while managing system complexity through automated feedback loops

Inventive Principle:
Principle #23Feedback

3Productivity

If hardware design changes are made without rack-level test room information, then development speed is maintained, but assessment of thermal performance effects is hindered

Engineering Contradiction:
Improvedevelopment speedVSAvoidthermal performance assessment
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The rack-level test room enables preliminary testing of hardware design changes before full-scale data center deployment. By conducting thermal performance assessments in the controlled test environment, potential issues are identified and resolved in advance, ensuring reliability while maintaining development productivity through iterative testing

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10285304B1Rack-level test room
Publication Date: 2019.05.07 AMD DESIGN LLC
  • US10285304B1 patent drawing
  • US10285304B1 patent drawing
  • US10285304B1 patent drawing

AI summary

A rack test room is disclosed that provides a controlled and monitored environment for one or more server racks, the room controlling and monitoring the cold aisle temperature, the cold aisle air inlet flow rate, and the hot aisle temperature. A rack test room is disclosed that monitors the inlet and exhaust air temperatures for each server in a rack. A rack test room is disclosed that individually controls and monitors the inlet air flow rate to each of a plurality of server racks. A method is disclosed for using a rack test room to simulate a data center environment.