Radar A/D Converter Digital Correction for Smaller Chip Area
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Solution Overview
Problem
The built-in A/D converters in on-vehicle millimeter wave radar devices occupy a large area and consume high power due to parallel operation, which limits the resolution and precision of distance, relative speed, and orientation calculations.
Innovation Solution
Implementing a single A/D converter with foreground digital correction type A/D converter technology, which reduces the chip area and improves resolution by using a pipeline type A/D converter and ΣΔ type D/A converter, allowing for sequential A/D conversion and digital correction, thereby reducing the need for sample hold capacitors and switches.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple A/D converters operate in parallel to process multiple reception signals simultaneously, then the processing speed and productivity are improved, but the chip area and power consumption increase significantly
Solution Approach 1:
The patent divides the A/D conversion process into two separate functional segments: a main A/D conversion unit for high-speed conversion and a reference A/D conversion unit for high-resolution conversion. This segmentation allows each unit to be optimized independently, with the main unit handling speed requirements and the reference unit handling precision requirements, thereby reducing the total chip area compared to using multiple full-function converters in parallel.
Solution Approach 2:
The reference A/D conversion unit serves multiple purposes: it provides high-resolution conversion for critical signals and simultaneously generates correction data for the main A/D conversion unit. This multi-functionality reduces the need for separate correction circuits and minimizes overall chip area while maintaining high processing efficiency.
2Productivity
If multiple A/D converters operate in parallel to process multiple reception signals simultaneously, then the processing speed and productivity are improved, but the power consumption increases significantly
Solution Approach 1:
The patent divides the A/D conversion process into two separate functional segments: a main A/D conversion unit for high-speed conversion and a reference A/D conversion unit for high-resolution conversion. This segmentation allows each unit to be optimized independently, with the main unit handling speed requirements and the reference unit handling precision requirements, thereby reducing the total chip area compared to using multiple full-function converters in parallel.
Solution Approach 2:
The reference A/D conversion unit serves multiple purposes: it provides high-resolution conversion for critical signals and simultaneously generates correction data for the main A/D conversion unit. This multi-functionality reduces the need for separate correction circuits and minimizes overall chip area while maintaining high processing efficiency.
3Area of stationary object
If a single A/D converter is used to process multiple reception signals sequentially, then the chip area and power consumption are reduced, but the processing speed decreases
Solution Approach 1:
The patent divides the A/D conversion process into two separate functional segments: a main A/D conversion unit for high-speed conversion and a reference A/D conversion unit for high-resolution conversion. This segmentation allows each unit to be optimized independently, with the main unit handling speed requirements and the reference unit handling precision requirements, thereby reducing the total chip area compared to using multiple full-function converters in parallel.
Solution Approach 2:
The reference A/D conversion unit performs preliminary high-resolution conversion and generates correction data in advance, which is then used to enhance the output of the main A/D conversion unit. This preliminary action allows the main unit to operate at high speed without sacrificing resolution, as the correction data compensates for any precision losses.
4Measurement precision
If high-resolution A/D conversion is implemented, then the measurement precision is improved, but the chip area increases due to additional correction circuits
Solution Approach 1:
The reference A/D conversion unit serves multiple purposes: it provides high-resolution conversion for critical signals and simultaneously generates correction data for the main A/D conversion unit. This multi-functionality reduces the need for separate correction circuits and minimizes overall chip area while maintaining high processing efficiency.
Solution Approach 2:
The patent uses a simplified reference A/D conversion unit that copies the essential conversion functionality from the main unit but with reduced complexity. This reference unit generates correction data that is applied to the main unit's output, achieving high resolution without requiring multiple full-resolution converters, thereby reducing chip area.
Data Source
AI summary
To improve resolution of a built-in A/D converter by reducing the area occupied by a chip of the built-in A/D converter in a semiconductor integrated circuit that is mounted in an on-vehicle millimeter wave radar device and which incorporates an A/D converter and an MPU. In the semiconductor integrated circuit, a plurality of reception signals of the radar device is A/D-converted by a single digital correction type A/D converter. The digital correction type A/D converter of the single A/D converter is a foreground digital correction type A/D converter that sequentially A/D-converts the reception signals output from a multiplexer of a receiving interface. The single A/D converter includes a pipeline type A/D converter having a plurality of cascade-coupled converters. The semiconductor integrated circuit comprises a correction signal generating unit, a digital correction D/A converter, and a digital correction unit for digital correction.