Pulsed Radar Interface Determination for Thin Layers

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Solution Overview

Problem

Conventional pulsed radar level sensing systems are unable to accurately measure liquid interfaces when the upper layer is less than 10 cm thick, as they rely on peak finding algorithms that require resolvable peaks, limiting the minimum measurable thickness to about 10 cm.

Innovation Solution

The method employs a pulse shape change analysis by comparing measured interface pulses to model-generated interface pulses, using refractive indices and thickness parameters in an interface level determination model, allowing for the measurement of interfaces as thin as 2 cm or less by iteratively updating the thickness value until residuals meet a predetermined threshold.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If peak finding algorithms are used for interface determination, then the system is simple to operate, but the measurement precision deteriorates for thin layers (less than 10 cm)

Engineering Contradiction:
Improvesimplicity of interface determinationVSAvoidinterface thickness measurement precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent changes the measurement parameter from peak position alone to the complete pulse shape characteristics. By analyzing the shape, width, and amplitude distribution of the reflected pulse rather than just peak position, the system can resolve interfaces in thin layers (2 cm or less) that were previously indistinguishable using conventional peak finding methods.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent transitions from one-dimensional peak position analysis to multi-dimensional pulse shape analysis. By examining multiple characteristics of the pulse (shape, width, amplitude distribution) simultaneously, the system gains additional measurement dimensions that enable precise interface detection in thin layers without increasing operational complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If conventional peak finding algorithms are used, then the device complexity is low, but the measurement precision for thin interfaces deteriorates

Engineering Contradiction:
Improvealgorithm complexityVSAvoidinterface thickness measurement precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent changes the analysis parameter from simple peak position to comprehensive pulse shape characteristics including width, amplitude distribution, and temporal profile. This parameter expansion enables precise measurement of thin interfaces (2 cm or less) while maintaining relatively simple implementation through direct comparison of measured pulses with model-generated reference pulses.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If the minimum measurable thickness is reduced from 10 cm to 2 cm, then the measurement precision improves, but the difficulty of detecting and measuring increases

Engineering Contradiction:
Improveminimum measurable thicknessVSAvoidinterface detection difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent performs preliminary action by generating model-generated interface pulses (MGIPs) that represent expected pulse shapes for various interface thicknesses before actual measurement. These pre-computed reference pulses are stored and used for direct comparison with measured pulses, eliminating the need for complex real-time analysis and reducing the difficulty of detecting thin interfaces.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent creates accurate copies of expected interface pulse responses through model-generated interface pulses (MGIPs). By comparing the measured pulse against these pre-computed reference copies for different thickness values, the system can precisely determine thin interface thicknesses without requiring complex real-time processing, thus reducing measurement difficulty.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the accurate determination of interface thickness and level for materials with a lower density, such as oil on water, improving the minimum measurable thickness from 10 cm to 2 cm or less, enhancing the precision of pulsed radar level sensing systems.

Implementation Method 1

measuring the round trip travel time of the pulse from the top of the probe to the level and the echo back to the top of the probe

Methodology Applied
Scientific EffectTime of flight: Time of Flight

Implementation Method 2

the electromagnetic fields see the higher dielectric constant of the material. This higher dielectric constant causes a reduction in the impedance of the propagating medium, resulting in a pulse echo being reflected back

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 3

the electromagnetic fields see the higher dielectric constant of the material

Methodology Applied
Scientific EffectDielectric permittivity: Dielectric Permittivity

Implementation Method 4

utilizes refractive indices for the materials and thickness of the second material

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentEP3209980B1Pulse shape change for interface determination
Publication Date: 2021.06.30 HONEYWELL INTERNATIONAL INC
  • EP3209980B1 patent drawingFigure 1
  • EP3209980B1 patent drawingFigure 2
  • EP3209980B1 patent drawingFigure 3A~3B

AI summary

A method (100) of pulsed radar interface determination for a first and second material in a tank (205), An interface level determination model is provided (101) including a transfer function that utilizes refractive indices for the materials and thickness of the second material. At least one actual radar pulse is transmitted (102) into the tank and a resulting echo curve portion including a measured interface pulse(s) around the interface location is measured. The interface model is simulated (103) with a reference pulse and an initial thickness value to generate an initial model generated interface pulse (initial MGIP). The measured interface pulse is compared (104) to the initial MGIP pulse point-by-point to determine residuals. If the residuals sum > a predetermined threshold, the comparing (105) is repeated with an updated interface model generated with an updated thickness value that provides an updated MGIP pulse. When the sum of residuals is < predetermined threshold, the thickness is determined (106).