Radiation Detection Device Offset Correction for Continuous X-ray Imaging
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Solution Overview
Problem
Existing X-ray imaging systems face challenges in accurately correcting offset and afterimage noise components during continuous X-ray irradiation, especially in real-time perspective imaging, where traditional offset correction methods are hindered by the presence of lag and dark current noise.
Innovation Solution
A radiation detection device and method that involves a processor to acquire and average multiple images before and after continuous X-ray irradiation, generating offset and afterimage images based on specific time intervals to correct radiographic images, thereby improving accuracy and suppressing afterimage influence.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional offset correction methods are used during continuous X-ray irradiation, then the offset correction can be performed, but the accuracy is degraded due to the presence of lag and dark current noise
Solution Approach 1:
The patent applies preliminary action by acquiring offset data at multiple predetermined time points (first time point after irradiation starts, second time point after irradiation ends) before actual imaging. This allows the system to pre-characterize the lag and dark current noise components under different irradiation conditions, enabling accurate noise correction during continuous irradiation without being affected by these harmful factors during the actual imaging process.
2Measurement precision
If multiple pieces of offset data are acquired and averaged to improve offset correction accuracy, then random noise is reduced, but the method cannot be applied during continuous X-ray irradiation in perspective imaging
Solution Approach 1:
The patent performs offset data acquisition at predetermined time points before actual imaging during continuous irradiation. By acquiring offset data in advance at the first time point (during irradiation) and second time point (after irradiation), the system prepares correction data that accounts for lag and dark current characteristics without interfering with the continuous imaging process.
Solution Approach 2:
The patent dynamically adjusts the offset correction approach by using time-dependent offset data acquisition. The system adapts to different irradiation states by acquiring offset data at specific time points relative to the irradiation timeline, enabling the offset correction method to be applicable during continuous irradiation scenarios where traditional static methods fail.
3Ease of manufacture
If offset data is acquired in a state where X-ray is not irradiated, then offset data can be obtained, but it cannot be acquired during continuous irradiation in perspective imaging
Solution Approach 1:
The patent acquires offset data at predetermined time points before actual imaging occurs. By collecting offset information in advance at the first time point (during irradiation) and second time point (after irradiation), the system prepares correction data that enables subsequent real-time imaging without interruption.
Solution Approach 2:
The patent maintains continuity of useful action by enabling offset data acquisition during continuous irradiation at the first time point. This eliminates the need to interrupt the continuous imaging process to acquire offset data, allowing both offset correction and real-time imaging to proceed continuously without stopping the X-ray irradiation.
4Measurement precision
If the scintillator layer retains influence from previous X-ray imaging, then lag occurs affecting image quality, but increasing irradiation time may reduce the relative impact
Solution Approach 1:
The patent applies preliminary action by acquiring offset data at the second time point after irradiation ends, when the lag effect has partially decayed. This allows the system to characterize the residual lag component and use it for correction, improving image quality without requiring extended irradiation times.
Solution Approach 2:
The patent uses feedback by utilizing the acquired offset data (which includes lag and dark current components) to correct the actual imaging data. The system feeds back the characterized noise components into the correction process, continuously improving image quality by compensating for lag effects based on previously measured offset characteristics.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the accuracy of offset correction and reduces the impact of afterimages in X-ray images, improving image quality by accounting for noise components over varying irradiation times.
Implementation Method 1
a pixel region in which a plurality of pixels for detecting the X-ray are arranged
Implementation Method 2
In the case of the indirect conversion method, the lag is a phenomenon that occurs in a case where the emission characteristics of a scintillator layer that converts the X-ray into visible light change
Data Source
AI summary
An average offset image is acquired without irradiation of a radiation. A first image is acquired when a first time elapses from continuous irradiation with the radiation for imaging a subject on a pixel region. A second image is acquired when a second time longer than the first time elapses from an end of the continuous irradiation. The irradiation with the radiation for imaging the subject is performed on the pixel region after an elapse of the second time from the end of the continuous irradiation and a pixel signal from the pixel region is read out to acquire a radiographic image. An offset image representing an offset component and an afterimage representing an afterimage component according to a time of the continuous irradiation, the first time, the second time, and a defined time are generated based on the first image, the second image, and the average offset image.