Radiation Detector with Dynamic Thin Film Transistor Control

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Solution Overview

Problem

Existing radiation detectors face challenges in accurately detecting the start time of radiation incidence and suffer from image quality degradation due to high power consumption and noise, particularly when using X-ray detectors, which can lead to limited imaging time and temperature increases.

Innovation Solution

A radiation detector design that includes a substrate with control lines and data lines, thin film transistors, a control circuit for switching between ON and OFF states, a signal detection circuit for reading image data when transistors are ON, and an incident radiation detecting part to determine the start time of radiation incidence, allowing for accurate detection and improved image quality by managing the reading process and storage of image data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the thin film transistors are set to the OFF-state to detect radiation incidence start time based on current difference, then the detection method is simpler, but the current value is extremely small making it difficult to detect with high accuracy

Engineering Contradiction:
Improvedetection method complexityVSAvoidradiation incidence start time detection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent dynamically switches the thin film transistor between ON-state and OFF-state based on the detection phase. During radiation incidence detection, the transistor is set to OFF-state for simplicity, but during image data reading, it is switched to ON-state to ensure accurate current measurement. This dynamic state change allows the system to leverage the advantages of both states without suffering from their respective disadvantages continuously.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If the thin film transistors are set to the ON-state to detect radiation incidence start time based on current difference, then the current value is large enabling high accuracy detection, but continuous reading increases power consumption and causes temperature increase

Engineering Contradiction:
Improveradiation incidence start time detection accuracyVSAvoidpower consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent implements periodic switching of the thin film transistor between ON-state and OFF-state. The transistor is set to ON-state only during the brief period when image data needs to be read, and switched to OFF-state during other periods to minimize power consumption. This periodic action ensures that high current (and thus high power) is drawn only when absolutely necessary for accurate image data acquisition, while reducing overall power consumption and heat generation during continuous operation.

Inventive Principle:
Principle #19Periodic action

3Measurement precision

If continuous reading of image data is performed to detect radiation incidence start time, then the detection can be performed, but the power consumption is large and noise may increase

Engineering Contradiction:
Improveradiation incidence start time detection capabilityVSAvoidnoise and power consumption
Core Design Contradiction:
Measurement precisionVSObject-generated harmful factors

Solution Approach 1:

The patent extracts and separates the radiation incidence detection function from the continuous image data reading process. By using the thin film transistor's OFF-state current characteristics specifically for incidence detection, the system eliminates the need for continuous ON-state reading. This extraction allows the system to use minimal power and generate minimal noise while still achieving accurate radiation incidence start time detection, reserving the higher-power ON-state reading only when actually needed.

Inventive Principle:
Principle #2Taking out (Extraction)

4Loss of time

If image data reading is performed when radiation incidence starts or ends during the reading process, then the incidence time can be detected, but image spots easily occur degrading image quality

Engineering Contradiction:
Improveradiation incidence time detectionVSAvoidimage quality
Core Design Contradiction:
Loss of timeVSReliability

Solution Approach 1:

The patent performs preliminary detection of radiation incidence start time using the thin film transistor's OFF-state current characteristics before initiating the image data reading process. By detecting the incidence start time in advance when the transistor is in OFF-state, the system can then switch to ON-state for reading the image data at the appropriate time, avoiding the problem of reading during incidence transitions that causes image spots. This preliminary action ensures both accurate timing detection and high image quality.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables accurate detection of radiation incidence start time and enhances X-ray image quality by reducing noise and power consumption, while minimizing image spots and temperature-related issues, thus improving the overall imaging process.

Implementation Method 1

a scintillator that is provided on the multiple photoelectric converters and converts X-rays into fluorescence

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 2

a photoelectric conversion element that converts the fluorescence from the scintillator into a charge

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS11733400B2Radiation detector
Publication Date: 2023.08.22 CANON ELECTRON TUBES & DEVICES CO LTD
  • US11733400B2 patent drawing
  • US11733400B2 patent drawing
  • US11733400B2 patent drawing

AI summary

According to an embodiment, a radiation detector includes: a substrate; multiple control lines; multiple data lines; multiple detecting parts detecting radiation including thin film transistors; a control circuit switching between ON and OFF-states of the transistor; a signal detection circuit reading image data when the transistor is in the ON-state; and an incident radiation detecting part determining an incidence start time of the radiation based on a value of the image data read when the transistor is in the ON-state. When the incident radiation detecting part determines that radiation incidence has started, the signal detection circuit performs a first reading process of further reading image data when the transistor is in the ON-state. The control circuit performs an image storage process of setting all of the transistors to the OFF-state after the first reading process.