Radiation Event Characterization Using IC Chains and Memory Faults
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Solution Overview
Problem
Existing radiation detection systems face challenges in accurately characterizing sudden abnormal radiation events and monitoring the durability of non-radiation hardened components in extreme space environments, which can lead to device malfunctions and mission interruptions.
Innovation Solution
A radiation detection system utilizing both radiation hardened and non-radiation hardened sensing components, with a controller to monitor and verify the integrity of IC chains and memory blocks, recording radiation exposure and identifying unexpected signals or data to determine the impact of Single Event Effects (SEEs) and Total Ionizing Dose (TID).
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If radiation hardened components are used, then reliability in radiation environments is improved, but device complexity and cost increase
Solution Approach 1:
The system segments radiation detection functions into separate IC chains with different radiation hardness levels. Rad-hard IC chains are placed on the radiation-exposed side of the substrate, while non-rad-hard chains are on the protected side, allowing differential testing without requiring entire systems to be rad-hardened.
Solution Approach 2:
Different regions of the system have different radiation hardness properties. The patent applies local quality by positioning rad-hard and non-rad-hard IC chains in specific locations relative to the radiation source, enabling targeted characterization of radiation effects on specific components rather than requiring uniform radiation hardness throughout the entire system.
2Reliability
If monitoring and characterization of radiation events is implemented, then device reliability is improved, but device complexity increases
Solution Approach 1:
The system merges radiation detection, monitoring, and characterization functions into an integrated test system. The controller combines data from multiple IC chains and a dosimeter to provide comprehensive radiation event characterization, eliminating the need for separate independent systems.
Solution Approach 2:
The test system is designed with multi-functionality to perform various radiation characterization tasks simultaneously. A single system can detect SEUs, measure TID, characterize radiation event spectra, and test both rad-hard and non-rad-hard components, providing universal radiation monitoring capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables effective characterization of radiation events and durability testing of non-radiation hardened components, allowing for the determination of whether COTS electronics can be used in space applications, reducing reliance on radiation hardened components and enhancing device reliability.
Implementation Method 1
each of the IC chains has a plurality of IC elements that is response to and generates a voltage when exposed to a radiation event
Data Source
AI summary
A system for detecting radiation events, having: a test memory with memory blocks; a controller having controller memory; an integrated circuit (IC) array having IC chains, wherein each of the IC chains has a plurality of IC elements that is response to and generates a voltage when exposed to a radiation event; a dosimeter configured to record an accumulated amount of radiation exposure to the system, wherein the controller is configured to perform steps of: initializing the test memory, the IC array and the dosimeter; monitoring for an unexpected signal from an IC chain and for unexpected data in a memory block of the test memory; and identifying the radiation event upon one or more of receiving the unexpected signal and identifying unexpected data in a memory block of the test memory.