Radiation Imaging Defect Map Selection for AEC
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Solution Overview
Problem
Existing radiation imaging apparatuses face challenges in accurately correcting defective pixels, particularly when automatic exposure control (AEC) is performed, leading to defective lines that cannot be used for generating radiation images.
Innovation Solution
A radiation imaging apparatus with a storage unit that maintains two defect maps, one excluding and one including defective linear pixel groups in the region of interest for AEC, and a correction unit that selects the appropriate map based on whether AEC is performed, allowing for accurate pixel correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If pixels are used for AEC detection, then automatic exposure control function is achieved, but linear pixel groups become defective and cannot be used for generating radiation images
Solution Approach 1:
The pixel array is segmented into multiple regions: AEC detection regions (first and second regions) and image generation regions (third and fourth regions). This spatial segmentation allows different pixel groups to serve different functions simultaneously, resolving the conflict between AEC capability and image quality.
Solution Approach 2:
The patent introduces a temporal dimension by switching between different defect maps based on operational mode. A first defect map is used when AEC is active, and a second defect map is used when AEC is inactive, allowing the system to adapt to different operational states and maintain optimal image correction in both scenarios.
2Device complexity
If a single defect map is used, then device complexity is reduced, but correction accuracy deteriorates when switching between AEC and non-AEC modes
Solution Approach 1:
The defect map selection is made dynamic based on the operational state. The system automatically switches between the first defect map (when AEC is performed) and the second defect map (when AEC is not performed), ensuring that the most appropriate correction data is always applied for the current operational mode.
Solution Approach 2:
The patent changes the parameter of defect map selection based on the AEC operational state. By monitoring whether AEC is active and selecting the corresponding defect map, the system adapts its correction parameters to match the current operational conditions, maintaining high correction accuracy across different modes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables effective and accurate correction of defective pixels both during and outside of AEC operations, improving image quality by appropriately handling defective pixels within the imaging system.
Implementation Method 1
a radiation detecting unit including a pixel region provided with a plurality of pixels for detecting the radiation, and outputting an electric signal related to a radiation image
Data Source
AI summary
An apparatus appropriately corrects a defective pixel of a radiation image in a radiation imaging apparatus having a function of AEC, both when performing AEC and when not performing AEC, the apparatus selecting a defect map from a first image defect map in which a defective pixel (line), which is a group of defective linear pixels, is not included in a region of interest for detecting the dose of radiation in a pixel region in order to perform an AEC pertaining to stopping of irradiation of radiation, and a second image defect map in which a defective pixel (line) which is a group of defective linear pixels, is included in a region of interest, depending on whether or not an AEC is performed, and corrects the radiation image using the selected defect map.