Radiation Imaging with Focused Fluorescence Signal Separation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing radiation imaging apparatuses, particularly those using solid immersion lenses (SIL), face challenges in achieving spatial resolutions beyond the theoretical limit due to difficulties in producing high-quality, thin scintillator films, leading to reduced optical performance and inability to image increasingly miniaturized targets.
Innovation Solution
The apparatus employs a scintillator-integrated solid immersion lens with a thin fluorescent film and a control unit that discriminates between focused and out-of-focus fluorescence signals, using a high numerical aperture optical system to enhance spatial resolution by extracting only focused signals, thereby improving image clarity and resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a solid immersion lens with a thin scintillator film is used to improve spatial resolution, then spatial resolution is improved to about 100 nm, but the optical quality deteriorates during thin film processing and production becomes extremely difficult
Solution Approach 1:
The patent introduces a matching layer between the scintillator film and the lens substrate to serve as an intermediary that optimizes optical coupling and reduces interface reflections. This matching layer facilitates the integration of thin scintillator films without compromising optical quality, thereby enabling high spatial resolution while improving manufacturability.
Solution Approach 2:
The patent modifies the refractive index parameters of the lens substrate and matching layer to optimize light transmission through the thin scintillator film. By carefully selecting and adjusting these optical parameters, the system achieves diffraction-limited resolution while maintaining practical manufacturability of the thin film structure.
2Measurement precision
If a solid immersion lens is used to reach the theoretical limit value, then spatial resolution reaches about 100 nm, but it is not possible to expect spatial resolution greatly exceeding the theoretical limit value
Solution Approach 1:
The patent replaces conventional mechanical focusing methods with a solid immersion lens that utilizes refractive index differences to achieve sub-diffraction-limit resolution. This substitution of the optical mechanism enables spatial resolution beyond the traditional theoretical limits, allowing imaging of increasingly miniaturized targets.
Solution Approach 2:
The patent employs a composite structure combining the scintillator film, matching layer, and lens substrate with carefully selected material properties. This composite material system enables the optical system to exceed conventional diffraction limits while maintaining practical manufacturability and adaptability for imaging nanoscale targets.
3Measurement precision
If an extremely thin scintillator film on the submicron scale is used, then spatial resolution is improved, but optical quality in the scintillator is likely to deteriorate during thin film processing
Solution Approach 1:
The matching layer acts as a protective and optical intermediary that shields the thin scintillator film from processing-induced damage while optimizing light transmission. This intermediary layer maintains the optical quality of the submicron-thick scintillator film throughout manufacturing processes.
Solution Approach 2:
The patent optimizes the thickness and refractive index parameters of both the scintillator film and matching layer to achieve a balance between resolution improvement and optical quality preservation. By carefully controlling these parameters, the system maintains reliable optical performance despite the extreme thinness of the scintillator film.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach achieves significantly improved spatial resolution, allowing for clearer high-definition imaging of miniaturized targets by effectively separating focused and out-of-focus signals, enhancing the imaging capability of the apparatus.
Implementation Method 1
a fluorescent film as a scintillator which converts incident X rays into visible light
Data Source
AI summary
A control unit of a radiation imaging apparatus includes: an exposure time control unit which controls a subframe exposure time of an image sensor such that focused fluorescence at a depth of field generated by radiation reaching a scintillator and out-of-focus fluorescence deviating from the depth of field are discretely imaged on a light receiving surface of the image sensor for each particle of the radiation; a focused signal discrimination unit which discriminates between sensor signals of a light receiving pixel group corresponding to spots of the focused fluorescence discretely included in each subframe and sensor signals of a light receiving pixel group corresponding to spots of the out-of-focus fluorescence; and an image signal processing unit which generates an image by overlaying subframe data based on the sensor signals from the light receiving pixel group corresponding to the spots of the focused fluorescence.