Radiation Imaging Pose Estimation for Batch Inspection Accuracy
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing automated inspection systems for small, safety-critical components face inefficiencies due to the need for individual item inspections, which are time-consuming and resource-intensive, especially when items have uncertain poses, leading to increased acquisition and processing times without significant quality improvement.
Innovation Solution
A method and system for dynamically estimating the pose of multiple items with uncertain orientations by iteratively refining pose estimation using numerical models and repositioning until accuracy criteria are met, allowing for near real-time, projection-based inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If individual item inspections are performed to ensure quality control accuracy, then measurement precision is improved, but productivity deteriorates due to time-consuming sequential processing
Solution Approach 1:
The patent combines multiple individual item inspections into a single batch inspection process. Multiple items are positioned on a holder and inspected simultaneously using a single radiation imaging sequence, merging what would traditionally be separate inspection operations into one unified process that maintains quality control while improving throughput.
Solution Approach 2:
The inspection system is designed to handle multiple different items in a single inspection batch. The system can inspect various items with different geometries and requirements simultaneously, making the inspection process universal and multi-functional rather than requiring dedicated inspection sequences for each individual item.
2Measurement precision
If the number of X-ray projections is increased to improve inspection coverage, then measurement precision is improved, but loss of time worsens due to longer acquisition times
Solution Approach 1:
The system uses a reduced number of X-ray projections compared to traditional individual inspection methods. By inspecting multiple items simultaneously with fewer projections, the system achieves adequate defect detection accuracy without the time penalty of acquiring extensive projection data for each item separately.
Solution Approach 2:
The patent merges the data acquisition for multiple items into a single set of X-ray projections. Instead of acquiring separate projection sequences for each item, the system captures all items in parallel using the same projection data, significantly reducing total acquisition time while maintaining sufficient inspection quality.
3Manufacturing precision
If items are inspected individually with precise pose verification, then manufacturing precision is improved, but productivity deteriorates due to sequential processing requirements
Solution Approach 1:
The patent combines pose estimation and verification for multiple items into a single batch process. The system estimates poses and performs verification for all items simultaneously during one inspection cycle, rather than processing items sequentially, thereby maintaining precision requirements while dramatically improving inspection speed.
Solution Approach 2:
The system performs preliminary pose estimation for all items in the batch before the actual inspection. By pre-establishing the poses of multiple items, the system can then proceed with the inspection phase without time-consuming individual pose verification during the inspection process itself.
4Productivity
If batch inspection of multiple items is performed to improve productivity, then productivity is improved, but measurement precision deteriorates due to uncertain poses
Solution Approach 1:
The system incorporates feedback mechanisms where the estimated poses of items in the batch are used to adjust and refine the inspection process. The pose estimation results feed into the inspection analysis, allowing the system to compensate for pose uncertainties and maintain measurement precision despite the batch processing approach.
Solution Approach 2:
The patent dynamically adjusts inspection parameters based on the estimated poses of items in the batch. By changing inspection parameters according to the actual pose conditions, the system maintains measurement precision even when items have uncertain or varying poses, resolving the contradiction between batch processing and precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables fast and accurate inspection of multiple items by reducing the number of required projections and processing times, facilitating efficient quality control in industrial applications.
Implementation Method 1
X-ray technology has been widely used in the inspection of manufactured products environments
Data Source
AI summary
The present disclosure relates to the field of radiation imaging for testing and/or quality assurance of items in a wide range of industrial applications. Specifically, in the present disclosure a method and system are described by which the item inspection accuracy and efficiency using radiation imaging technology can be improved.