Radiation Imaging System for Uncertain Item Pose Inspection

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Solution Overview

Problem

Existing automated inspection systems for small, safety-critical components face inefficiencies due to the need for individual item inspections, which are time-consuming and resource-intensive, especially when items have uncertain poses, leading to increased acquisition and processing times.

Innovation Solution

A method and system for dynamically estimating the pose of multiple items with uncertain orientations using radiation imaging, iteratively refining the pose estimation until the desired accuracy is achieved, allowing for near real-time, projection-based inspection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If individual item inspections are performed to ensure accurate pose verification, then measurement precision is improved, but productivity deteriorates due to time-consuming sequential processing

Engineering Contradiction:
Improvepose estimation accuracyVSAvoidinspection throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent combines multiple item inspections into a single batch processing operation. Multiple items are positioned on a holder and inspected simultaneously using a single radiation imaging sequence, eliminating the need for sequential individual inspections while maintaining pose estimation accuracy through collective analysis of all items in the batch.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system performs preliminary pose estimation on multiple items simultaneously before detailed inspection. By estimating poses for all items in advance using initial imaging data, the system can optimize the inspection sequence and reduce total processing time while ensuring accurate pose verification for each item.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If the number of X-ray projections is increased to improve defect detection accuracy, then measurement precision is improved, but loss of time increases due to longer acquisition and processing times

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidacquisition and processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs pose estimation and defect inspection using a limited number of projections rather than complete 360-degree scanning. By acquiring projections only over a limited angular range sufficient for pose determination and defect detection, the system achieves acceptable accuracy with significantly reduced acquisition and processing time.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The inspection system focuses computational resources and imaging efforts on critical regions of items where defects are most likely to occur. By applying targeted analysis to specific regions of interest rather than uniformly processing entire items, the system maintains high defect detection accuracy while reducing overall processing requirements.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables fast and accurate inspection of multiple items simultaneously, reducing the number of required X-ray projections and processing time, suitable for in-line quality control applications like defect detection or metrology.

Implementation Method 1

radiation imaging system for inspection of items

Methodology Applied
Scientific EffectX-ray transmission: X-Ray

Implementation Method 2

detector configured for acquiring a projection image as image data

Methodology Applied
Scientific EffectRadiation detection: Photoelectric Effect

Data Source

PatentEP4533074B1Radiation imaging system for inspection of items having an uncertain pose and method therefor
Publication Date: 2026.03.11 DELTARAY BV
  • EP4533074B1 patent drawingFigure 1~2
  • EP4533074B1 patent drawingFigure 3~5
  • EP4533074B1 patent drawingFigure 6~8

AI summary

The present disclosure relates to the field of radiation imaging for testing and/or quality assurance of items in a wide range of industrial applications. Specifically, in the present disclosure a method and system are described by which the item inspection accuracy and efficiency using radiation imaging technology can be improved.