Radiation Inspection Detector Tracking for High-Speed Defect Detection
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Solution Overview
Problem
Existing inline inspection methods using electromagnetic waves struggle to achieve high-speed sample conveyance with high resolution, high sensitivity, and high signal-to-noise ratio (S/N) due to limitations in detector technology and sample conveyance speed, leading to inaccurate defect detection and trade-offs between temporal resolution and S/N.
Innovation Solution
An inspection device with a conveyance mechanism, radiation source, detector, and movement mechanism that moves the detector in sync with the sample, maintaining a speed ratio Vd/Vw of twice or less than the ratio of radiation source to detector distance, combined with a thickness-measuring instrument and calculation means to determine defect positions accurately.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the sample conveyance speed is increased to enhance productivity, then the inspection throughput is improved, but the image brightness decreases and the signal-to-noise ratio deteriorates
Solution Approach 1:
The detector is moved synchronously with the sample conveyance, creating a dynamic detection system where the detector position changes over time to track the sample movement. This allows the detector to remain optimally positioned relative to the radiation source and sample, maintaining detection sensitivity even at high conveyance speeds.
Solution Approach 2:
The detector position is pre-calculated and adjusted based on the known sample conveyance speed and the geometric relationship (Vd/Vw ≤ 2×FDD/FOD). This preliminary positioning ensures that the detector is always in the optimal detection position before the sample passes through the radiation field, maximizing signal capture.
2Loss of time
If the sample conveyance speed is increased, then the inspection cycle time is reduced, but the temporal resolution and image quality deteriorate
Solution Approach 1:
The synchronous movement of the detector with the sample creates a dynamic imaging system that maintains temporal resolution by continuously tracking the sample position. The detector captures radiation data at multiple positions along the conveyance path, effectively increasing the number of measurement points without increasing the conveyance speed.
Solution Approach 2:
The detection process is extended from a single static position to multiple dynamic positions along the conveyance direction. By moving the detector synchronously with the sample, the system captures radiation transmission data across multiple spatial dimensions, effectively increasing temporal resolution through spatial sampling.
3Speed
If a higher scan rate detector is used to support high-speed inspection, then the sample conveyance speed can be increased, but the device complexity and cost increase
Solution Approach 1:
Instead of requiring a detector with extremely high scan rate capabilities, the system uses a detector that moves synchronously with the sample at a controlled speed ratio (Vd/Vw ≤ 2×FDD/FOD). This dynamic approach allows the use of standard detectors with lower scan rate requirements while achieving high-speed inspection capabilities.
Solution Approach 2:
The movement mechanism acts as an intermediary between the sample conveyance system and the detector, mediating the speed mismatch. By introducing this intermediate motion layer, the system decouples the detector scan rate requirements from the sample conveyance speed, allowing independent optimization of each component.
4Device complexity
If the detector remains stationary while the sample moves at high speed, then the device complexity is reduced, but the defects may be detected as single defects when multiple defects overlap, leading to inaccurate inspection
Solution Approach 1:
The detector moves synchronously with the sample conveyance, creating multiple detection positions for the same sample region over time. This dynamic multi-position detection separates overlapping defects that would appear as a single defect in static detection, enabling accurate individual defect identification and counting.
Solution Approach 2:
The system pre-calculates the detector movement trajectory and timing based on the sample conveyance speed and defect separation requirements. This preliminary planning ensures that the detector passes through multiple positions relative to each defect, creating distinct detection signals for overlapping defects before they can be misidentified as a single defect.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-speed sample conveyance with high resolution, sensitivity, and S/N, allowing accurate detection of minute defects, including low-contrast ones, by optimizing detector movement relative to sample speed and using flexible detectors with radial irradiation.
Implementation Method 1
a radiation source that radially irradiates a region through which the conveyed sample passes with radiation
Implementation Method 2
a detector that is disposed to be able to detect radiation transmitted through the conveyed sample and converts the detected radiation into an electrical signal
Implementation Method 3
the condition of the afterglow characteristics of a scintillator, which is a phosphor that converts X-rays into visible light
Data Source
AI summary
The present disclosure provides an inspection device including a conveyance mechanism; a radiation source; a detector; a movement mechanism; and a determination means. The present disclosure also proposes using the device to inspect foreign matter in the sample.