Radiation Pulse Scheduling for Adaptive Object Inspection
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Solution Overview
Problem
Existing inspection systems face challenges with adaptability, as they are either poorly adaptable to different objects due to single ray sources or have higher costs and weights due to the use of multiple ray sources.
Innovation Solution
An inspection system that includes a radiation source, a detector, and a processor to determine and select periodic radiation combinations based on the object's type and mode, allowing for the emission of radiation with varying energies to different portions of the object, optimizing energy usage and adaptability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single specific ray source is used in the inspection system, then the device complexity is reduced, but the adaptability to different types of inspected objects deteriorates
Solution Approach 1:
The patent implements dynamic switching between different ray energy modes (first mode with lower energy, second mode with higher energy) based on the inspection requirements. The system can dynamically adjust the ray source characteristics during operation to match different inspected objects, resolving the contradiction between fixed device complexity and variable adaptability requirements.
Solution Approach 2:
The patent changes the energy parameter of the ray source by switching between different operational modes. The first mode uses lower ray energy for objects requiring reduced radiation exposure, while the second mode uses higher ray energy for thicker or denser objects, allowing a single device to adapt to multiple inspection scenarios without increasing physical complexity.
2Adaptability or versatility
If two different ray sources are used in the inspection system, then the adaptability to different inspected objects is improved, but the device complexity and cost increase
Solution Approach 1:
The patent makes a single ray source perform multiple functions by enabling it to operate in different energy modes. The same ray source can serve both low-energy inspection requirements (first mode) and high-energy inspection requirements (second mode), eliminating the need for separate ray sources while maintaining full adaptability across different object types.
Solution Approach 2:
The patent combines the functionality of multiple ray sources with different energy levels into a single unified ray source system. By merging the capabilities of what would traditionally require separate devices into one system with switchable modes, the patent achieves full adaptability while reducing overall device complexity and cost.
3Adaptability or versatility
If two different ray sources are used in the inspection system, then the adaptability to different inspected objects is improved, but the total weight increases
Solution Approach 1:
The patent makes a single ray source perform multiple functions by enabling it to operate in different energy modes. The same ray source can serve both low-energy inspection requirements (first mode) and high-energy inspection requirements (second mode), eliminating the need for separate ray sources while maintaining full adaptability across different object types.
4Adaptability or versatility
If two different ray sources are used in the inspection system, then the adaptability to different inspected objects is improved, but the cost increases
Solution Approach 1:
The patent makes a single ray source perform multiple functions by enabling it to operate in different energy modes. The same ray source can serve both low-energy inspection requirements (first mode) and high-energy inspection requirements (second mode), eliminating the need for separate ray sources while maintaining full adaptability across different object types.
Solution Approach 2:
The patent combines the functionality of multiple ray sources with different energy levels into a single unified ray source system. By merging the capabilities of what would traditionally require separate devices into one system with switchable modes, the patent achieves full adaptability while reducing overall device complexity and cost.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves the adaptability and efficiency of the inspection system by dynamically adjusting radiation energy based on the object's type and mode, reducing weight and cost while enhancing scanning effectiveness.
Implementation Method 1
a microwave generating device configured to generate a microwave
Implementation Method 2
accelerating tubes connected with the electronic beam generating device, respectively connected with the at least two power output ports, configured to respectively receive electronic beams generated by the electronic beam generating device, and accelerate electronic beams respectively through microwaves received from the at least two power output ports
Implementation Method 3
a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object
Data Source
AI summary
An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.


