Radiometric Calibration Using Gamma Ray Segmentation
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Solution Overview
Problem
Radiometric measurement systems face challenges in achieving high calibration accuracy with minimal effort due to scattered radiation, which is difficult to model accurately, often resulting in measurement errors from limited calibration points.
Innovation Solution
A method that involves measuring one known process value using unscattered gamma rays to create a calibration assignment, and then modifying it by incorporating scattered gamma rays, allowing for precise determination of unknown process values without the need for complex calculations or extensive calibration points.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If calibration is performed using only unscattered gamma rays with a simple process model, then computing time and calibration effort are reduced, but measurement precision deteriorates due to ignoring scattered radiation
Solution Approach 1:
The patent segments the gamma ray population into two distinct groups: unscattered gamma rays and scattered gamma rays. By separating these two components, the system can apply different handling strategies to each - using unscattered rays for fast, simple calibration while incorporating scattered rays to improve precision, thus resolving the contradiction between computing time and measurement precision
Solution Approach 2:
The patent changes the parameter of gamma ray energy threshold to distinguish between unscattered and scattered gamma rays. By setting an energy threshold, the system can selectively process different types of gamma rays, enabling the dual approach of using unscattered rays for speed and scattered rays for accuracy
2Measurement precision
If multiple calibration points are measured to improve calibration accuracy, then measurement precision improves, but calibration effort and device complexity increase
Solution Approach 1:
The patent extracts only the unscattered gamma ray component for the purpose of creating the initial calibration assignment. By taking out this specific component, the system can perform calibration with minimal effort using a simple process model, while still achieving good accuracy. The scattered gamma rays are then added as a supplementary correction
Solution Approach 2:
The patent performs preliminary calibration using only unscattered gamma rays and a simple process model to establish a baseline calibration assignment. This preliminary action provides a good starting point that requires minimal calibration effort, and then scattered gamma rays are incorporated as a refinement to improve precision further
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the calibration process, reduces computing time, and achieves accurate process value determination by distinguishing between unscattered and scattered gamma rays, enhancing measurement precision with minimal initial effort.
Implementation Method 1
measuring a detector value by detection of gamma rays which have at least partially penetrated the material
Implementation Method 2
scattered radiation... gamma rays scatter in different ways... measuring first-type detector values based only on detected gamma rays which are not or only slightly scattered, and measuring second-type detector values based at least on detected gamma rays which are scattered
Data Source
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AI summary
The invention relates to a method for calibrating a device (1) for measuring a process value (PW) of at least one substance (ST), wherein the device (1) comprises a detector device (2), the detector device (2) being configured to measure a detector value (DW) by detecting gamma rays (GR) that have at least partially penetrated the substance (ST) and generating the detector value (DW) based on the detected gamma rays (GR), wherein the method comprises the steps: a) for a known process value (PW), measuring a first-type detector value (DW1) based only on detected gamma rays (GR) that are unstratified or only slightly scattered, b) calculating a calibration assignment (CT) based on a process model (PM), wherein the process model (PM) is based on a description of penetration considering only unstratified gamma rays (GR), and based on the measured first-type detector value (DW1).wherein the calibration assignment (CT) assigns a primary detector value (DW1) to each of the different process values (PW), c) for at least one unknown process value (PW), measuring a primary detector value (DW1) and measuring a secondary detector value (DW2) at least based on detected gamma rays (GR) that are scattered or more scattered, d) determining the unknown process value (PW) using the calculated calibration assignment (CT) based on the measured primary detector value (DW1), and e) modifying the calibration assignment (CT) by assigning the measured secondary detector value (DW2) to the determined process value (PW).