RAM Diagnostic Apparatus Using Segmented Idle-Time Testing
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Solution Overview
Problem
Conventional RAM diagnostic methods require significant processing time and resource allocation, making them unsuitable for embedded systems where they disrupt application availability and cannot perform time-division processing effectively.
Innovation Solution
A memory diagnostic apparatus that divides the RAM into multiple regions and performs diagnostic operations during idle system periods, using a method to detect coupling faults by executing diagnostic tests on all pairs of regions, allowing for efficient and non-disruptive fault detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the entire RAM is diagnosed at once using conventional diagnostic methods, then memory faults can be detected, but application availability is significantly affected due to long processing time
Solution Approach 1:
The RAM is divided into multiple partial regions, and diagnosis is performed on each region separately during idle time periods. This segmentation allows the diagnostic process to be distributed over time without blocking application execution, thus maintaining application availability while still detecting faults effectively.
Solution Approach 2:
The diagnostic process is executed periodically during idle time slots in the system operation cycle. By performing diagnosis only during these periodic idle intervals rather than continuously or blocking application execution, the system maintains high application availability while still achieving comprehensive fault detection over time.
2Reliability
If conventional diagnostic methods are applied to embedded systems, then memory faults can be detected, but the method cannot be adapted for periodic processing typical of embedded systems
Solution Approach 1:
The diagnostic method is specifically designed to execute during idle time periods of the embedded system's periodic operation cycle. This periodic execution model allows the diagnostic function to adapt seamlessly to embedded systems' typical periodic processing patterns, making the method versatile and adaptable to various embedded applications.
Solution Approach 2:
The diagnostic process dynamically adapts to the system's operational state by executing only during idle time periods rather than following a fixed schedule or blocking execution. This dynamic behavior allows the diagnostic method to accommodate varying system loads and periodic processing requirements of different embedded applications.
3Reliability
If read and write operations are performed on the entire RAM, then comprehensive fault detection is achieved, but a large amount of processing time is required
Solution Approach 1:
By dividing the RAM into multiple partial regions and diagnosing each region separately during idle time, the total diagnostic processing time is distributed across multiple short intervals rather than requiring one long continuous period. This maintains comprehensive fault detection coverage while reducing the time loss impact on application execution.
Solution Approach 2:
The diagnosis is performed in partial steps on individual regions rather than attempting to diagnose the entire RAM at once. This partial action approach allows the system to accumulate diagnostic coverage over multiple idle periods without requiring excessive processing time in any single interval, thus balancing comprehensiveness with time efficiency.
Data Source
AI summary
A RAM to be diagnosed is divided into n (n being an integer of 3 or greater) pieces of base regions. In an idle time of periodic processing performed in a system in which the RAM is incorporated, two base regions are selected from the divided base regions, and the selected two base regions are diagnosed using a diagnostic method capable of detecting a coupling fault. Thereafter, in an idle time of the periodic processing, operations to select an unselected pair of base regions and diagnose the selected pair are repeated, so as to diagnose all combinations of pairs.