Raman Spectrometer With Evaporation-Tracked SERS Interface

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Solution Overview

Problem

Existing SERS techniques struggle to achieve continuous measurements with high enhancement factors, as metal nanoparticles aggregate during evaporation, limiting detection to femtomolar levels only for a fixed period.

Innovation Solution

A Raman scattering spectrometric apparatus and method utilizing a 3D microfluidic SERS chip with a nanostructured metal thin film, where Raman scattering light is measured at the interface of an analyte solution, allowing control of laser beam position to maintain signal intensity during evaporation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If metal nanoparticles are densely dispersed in solution and left after evaporation to achieve high enhancement factor, then Raman scattering intensity is enhanced, but the nanoparticles aggregate completely together after evaporation and the enhancement factor is no longer acquired

Engineering Contradiction:
ImproveRaman scattering intensityVSAvoidnanoparticle dispersion state
Core Design Contradiction:
Illumination intensityVSStability of the object's composition

Solution Approach 1:

The patent utilizes the phase transition of water from liquid to vapor during evaporation to drive the formation and stabilization of nanoparticle aggregates. By controlling the evaporation process, the system achieves high enhancement factors while maintaining measurement continuity, resolving the contradiction between intensity enhancement and compositional stability

Inventive Principle:
Principle #36Phase transitions

Solution Approach 2:

The patent employs dynamic control of the measurement process during evaporation. The system adapts to changing conditions by continuously adjusting measurement parameters as the nanoparticle aggregate evolves, enabling sustained high-enhancement measurements despite the dynamic nature of the aggregate structure

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If dynamic SERS is used to allow detection at fM or smaller levels, then detection sensitivity is improved, but the measurement can only be performed for a fixed period of time

Engineering Contradiction:
Improvedetection sensitivityVSAvoidmeasurement duration
Core Design Contradiction:
Measurement precisionVSDuration of action of moving object

Solution Approach 1:

The patent extends the useful action period by utilizing the evaporation process to continuously concentrate analytes in the nanoparticle aggregate. As water evaporates, the aggregate remains stable and continues to provide high enhancement factors, enabling prolonged measurement capability rather than fixed-time only detection

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system incorporates feedback mechanisms to monitor the evaporation process and adjust measurement parameters accordingly. This allows the system to maintain optimal measurement conditions throughout the evaporation process, extending the useful measurement duration while preserving detection sensitivity

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables continuous Raman scattering spectroscopy with enhancement factors up to 1014, achieving detection sensitivity of 10 to 100 attomolar concentrations, surpassing conventional limits.

Implementation Method 1

measuring means for measuring Raman scattering light induced by irradiation with the laser beam

Methodology Applied
Scientific EffectRaman scattering: Scattering

Implementation Method 2

the enhancement factor decreases somewhat in the state in which the analyte is not included in the irradiation area of the laser beam due to evaporation

Methodology Applied
Scientific EffectEvaporation: Evaporation

Data Source

PatentUS12449365B2Raman scattering spectrometric apparatus and Raman scattering spectroscopic method
Publication Date: 2025.10.21 RIKEN CO LTD
  • US12449365B2 patent drawing
  • US12449365B2 patent drawing
  • US12449365B2 patent drawing

AI summary

The Raman scattering spectroscopic method according to the present invention include: preparing a chip having a channel in which a nanostructure is formed; introducing an analyte solution into a part of the channel in the chip; irradiating an interface of the analyte solution with a laser beam; and measuring Raman scattering light induced by the irradiation of the laser beam. The measurement may be performed, with a fixed laser beam irradiation position, both in a state where the interface of the analyte solution is included in the laser-beam-irradiation area and in a state where the interface of the analyte solution is not included in the laser-beam-irradiation area, or may be performed keeping the state where the interface of the analyte solution is maintained in the laser-beam-irradiation area by controlling the laser-beam-irradiation area according to the movement of the interface due to evaporation of the analyte solution.