Raman Spectrometer Slit Array for Signal Strength and FOV
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Solution Overview
Problem
Conventional Raman spectrometers have limited Field of View (FOV), shallow Depth of Field (DOF), and significant signal loss due to the use of single narrow slits, which restricts their ability to capture material attributes effectively.
Innovation Solution
A Raman spectrometer with a single-use sample holder and arrays of collection lenses, slits, and collimation lenses to enhance FOV, DOF, and light capture, along with features for chain-of-custody and data logging, allowing for spatially averaged material characterization without scanning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single narrow slit is used in the optical path, then spectral resolution is improved, but optical signal strength is significantly reduced
Solution Approach 1:
The patent divides the single narrow slit into multiple slits arranged in an array configuration. Each slit contributes to the overall spectral resolution while the combined aperture of multiple slits captures more optical signal, thereby resolving the contradiction between spectral resolution and signal strength.
2Loss of energy
If a microscope objective with high NA is used, then light collection from a small sample point is maximized, but Field of View is limited and Depth of Field becomes shallow
Solution Approach 1:
The patent replaces the single microscope objective with an array of multiple objectives, each with high numerical aperture. This segmentation allows each objective to maintain excellent light collection efficiency from its local sample region while the collective array provides a much larger overall field of view and increased depth of field.
3Loss of energy
If a single microscope objective is used, then light collection from a small area is optimized, but scanning is required to cover larger sample areas, reducing productivity
Solution Approach 1:
The patent employs an array of multiple microscope objectives instead of a single objective requiring scanning. Each objective simultaneously captures light from its designated sample region, enabling parallel acquisition of spectral data across the entire sample area, thereby eliminating scanning requirements and significantly improving productivity.
Solution Approach 2:
The patent enables continuous spectral acquisition across the entire sample area through the parallel operation of multiple objectives. This eliminates the intermittent scanning process where the beam must move between positions, providing continuous measurement and maximizing productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides a robust, compact Raman spectrometer with improved FOV and DOF, reduced signal loss, and enhanced data management, enabling accurate and efficient material analysis and verification.
Implementation Method 1
a sample lens array that is coupled to the sample plate and comprises a plurality of focusing elements
Data Source
AI summary
An apparatus for analysis of a sample of a material is disclosed. The apparatus has a body configured to accept the sample and a detector with a plurality of points. The detector is configured to provide a signal about the intensities of light received at the points. The apparatus also includes a slit array having a plurality of slits configured to collected light from the accepted sample and a collimating lens array having a plurality of lenses configured to receive the light from the slit array and collimate the collected light. The apparatus also includes a diffraction grating configured to diffract the light received from the collimating lens array and a focusing lens configured to focus the diffracted light of a common frequency on a common point of the detector.