Randomized Test Case Generation for Device Characterization

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Current methods for testing complex devices are time-consuming, error-prone, and insufficient, as they involve sequential and deterministic test case generation, which limits the coverage of the parameter space and fails to detect errors effectively, especially in high-dimensional optimization scenarios.

Innovation Solution

A test apparatus and method that randomly generates test cases to cover a wide variety of the parameter space, using a data analysis unit to determine dependencies between variables, and employing LASSO regression to analyze test data, allowing for early error detection and reduced test time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If predetermined tests are created and run sequentially, then specific measurements are obtained, but the process is time-consuming and error-prone

Engineering Contradiction:

Improvemeasurement accuracyVSAvoidtest execution time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent inverts the traditional sequential test execution approach by using randomized test case generation and execution. Instead of following a predetermined sequence, tests are generated and executed in random order, allowing parallel execution and significantly reducing test time while maintaining measurement accuracy through statistical analysis of the collected data.

Inventive Principle:

Principle #13The other way round (Inversion)

Solution Approach 2:

The patent performs preliminary actions by generating a large set of randomized test cases beforehand and executing them in parallel or random order. This preliminary comprehensive testing approach allows for early error detection and reduces the need for iterative test creation and debugging, thereby reducing overall test time.

Inventive Principle:

Principle #10Preliminary action

2Loss of information

If individual tests are created for each measurement request, then specific plots are obtained, but the process is error-prone and time-consuming

Engineering Contradiction:

Improvemeasurement completenessVSAvoidtest development efficiency

Core Design Contradiction:

Loss of informationVSProductivity

Solution Approach 1:

The patent creates a universal test framework that generates randomized test cases covering multiple variables and measurement types simultaneously. This multi-functional approach allows a single test execution to produce multiple plots and measurements, eliminating the need to create individual tests for each specific measurement request and significantly improving test development efficiency.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges multiple individual test cases into a comprehensive randomized test suite. By combining various measurement types, variable combinations, and test conditions into a unified random testing approach, the system achieves complete measurement coverage without the overhead of creating and maintaining separate tests for each measurement.

Inventive Principle:

Principle #5Merging (Combining)

3Adaptability or versatility

If nested loops are used to sweep all variables, then complete coverage is achieved, but the approach is insufficient for high-dimensional spaces

Engineering Contradiction:

Improveparameter space coverageVSAvoidtest structure complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent changes the fundamental parameter of test case generation from deterministic nested loops to randomized parameter selection. This allows the test system to effectively explore high-dimensional parameter spaces by randomly sampling combinations of variables, achieving comprehensive coverage without the exponential complexity increase associated with exhaustive nested loop approaches.

Inventive Principle:

Principle #35Parameter changes

4Reliability

If tests are run sequentially with debugging, then errors are detected, but the process is time-consuming

Engineering Contradiction:

Improveerror detection capabilityVSAvoidtest iteration time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent performs preliminary error detection by executing a large number of randomized test cases before formal verification. This preliminary random testing approach identifies errors early in the development process, reducing the need for time-consuming iterative debugging and formal verification while maintaining high reliability through comprehensive error coverage.

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS11036623B2Test apparatus and method for characterizing a device under test

Publication Date: 2021.06.15 ADVANTEST CORP

AI summary

A test apparatus for characterizing a device under test includes a test case generator, a test unit, a data storage unit, and a data analysis unit. The test case generator is configured to randomly generate a plurality of test cases, which include values of one or more input variables of a set of input variables. The test unit is configured to perform the plurality of test cases on the device under test. The data storage unit may store sets of test data, which are associated to the test cases and include values of input variables of a respective test case and corresponding values of output variables of the device under test related to the respective test case. The data analysis unit may further analyze the test data and is further configured to determine dependencies within a subset of variables of the test data to characterize the device under test.