Randomized Test Condition Selection for Operator Error Reduction
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Solution Overview
Problem
Human operators in quality assurance testing of electronic devices often miss failures due to automatic response and repeated patterns of behavior, leading to incorrect confirmation of device states during testing.
Innovation Solution
A testing system that randomly selects test conditions for Light Emitting Diodes (LEDs) and Liquid Crystal Displays (LCDs) on Devices Under Test, prompting operators to confirm matching output conditions to reduce the likelihood of automatic responses and ensure accurate testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If human operators repeatedly test devices using the same testing pattern, then testing efficiency is improved, but operator error increases due to automatic response
Solution Approach 1:
The testing system dynamically changes the test conditions by randomly selecting different display outputs (colors, patterns, text) for each test iteration. This prevents operators from falling into automatic response patterns while maintaining efficient testing throughput, directly resolving the contradiction between testing efficiency and accuracy
Solution Approach 2:
The system changes the parameters being tested by selecting from multiple different display conditions (various colors, patterns, text strings) rather than using a fixed test pattern. This variation in test parameters keeps operators engaged and accurate while maintaining high testing speed
2Ease of operation
If operators confirm device states using fixed test patterns, then testing process is simplified, but failure detection accuracy deteriorates
Solution Approach 1:
The testing process remains simple for operators to execute (confirm what they see on screen), but the actual test conditions dynamically change with each iteration. This maintains ease of operation while improving failure detection accuracy through varied test stimuli
Solution Approach 2:
The system implements periodic variation in test conditions by randomly selecting different display outputs at regular testing intervals. This periodic change in test parameters improves failure detection while keeping the operator's task consistently simple
Data Source
AI summary
Systems and methods for testing a Device Under Test (DUT). A test condition is randomly selected from a plurality of test conditions to test the DUT. The DUT is controlled to attempt to output an output condition matching the randomly selected test condition and an operator is prompted to confirm that the output condition matches the randomly selected test condition.