Rapid High-Resolution CT Inspection Using Parallel Imaging Chains
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Solution Overview
Problem
Existing CT inspection systems require lengthy inspection times due to the need for full 360-degree object rotation, leading to increased manufacturing costs and delayed product delivery schedules.
Innovation Solution
Implementing multiple imaging chains with X-ray tubes and detectors to acquire CT data simultaneously during sector scans, reducing the need for a full 360-degree rotation and enabling rapid high-resolution object inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If full 360-degree object rotation is performed to acquire sufficient CT inspection data, then measurement precision is improved, but inspection time increases
Solution Approach 1:
The patent divides the 360-degree rotation into multiple sector scans performed by multiple imaging chains simultaneously. Each imaging chain captures data for a specific angular sector, and the complete object inspection is assembled from these segmented sectors, reducing total inspection time while maintaining data quality
Solution Approach 2:
The patent transitions from a single sequential scanning approach to a parallel multi-dimensional approach by employing multiple imaging chains that operate simultaneously at different angular positions, effectively adding a temporal parallelism dimension to the inspection process
2Measurement precision
If multiple inspection configurations are used to acquire sufficient CT data, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent designs multiple imaging chains with identical X-ray tube and detector configurations that can operate independently but contribute to the same inspection task, allowing the system to achieve better measurement precision without requiring fundamentally different inspection configurations
Solution Approach 2:
The patent combines data from multiple imaging chains and multiple sector scans into a unified CT reconstruction, merging the inspection capabilities of individual chains into a cohesive system that achieves high-resolution inspection more efficiently
3Productivity
If inspection time is reduced for faster production, then productivity is improved, but measurement precision may deteriorate
Solution Approach 1:
The patent maintains continuous data acquisition by having multiple imaging chains operate simultaneously throughout the inspection process, eliminating idle time between scans and ensuring that sufficient data is collected continuously to maintain measurement precision while reducing total inspection time
Solution Approach 2:
The patent performs preliminary angular positioning and synchronization setup before the actual data acquisition, allowing the multiple imaging chains to begin capturing data immediately at their respective angular positions, thereby reducing the overall inspection time while maintaining data quality
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces inspection time, allowing for in-line manufacturing and faster production of high-priority objects, such as batteries, by utilizing multiple imaging chains to collect and reconstruct CT data from sector scans.
Implementation Method 1
The inspection data can be computed tomography data
Implementation Method 2
at least one X-ray detector configured in respective association with the X-ray tube
Data Source
AI summary
A method for inspecting an object using CT is provided. In an embodiment, the method can include providing an object for an inspection. The object can be provided on a base configured to rotate the object. The method can also include acquiring a first plurality of inspection data characterizing the object during rotation through a first scan sector. The first plurality of inspection data can be acquired by a first inspection chain. The method can further include acquiring a second plurality of inspection data characterizing the object during rotation through a second scan sector. The second plurality of inspection data can be acquired by a second inspection chain. The method can also include providing the first plurality of inspection data and the second plurality of inspection data. Related systems, apparatuses, and non-transitory computer readable mediums are also provided.