Raw Material Particle Size Correction From Surface Layer Sensing
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Solution Overview
Problem
Conventional methods for measuring particle size distribution of raw materials in manufacturing processes, such as in blast furnaces, are limited by the non-uniformity of particle size across different layers, leading to inaccurate real-time adjustments due to particle size segregation, making it difficult to achieve high-precision corrections.
Innovation Solution
An information processing apparatus that uses sensors to measure the surface layer of deposited raw materials, calculates an index related to particle diameter, and corrects it based on measurement data such as layer thickness, brightness, and conveyance amount to reflect the entire layer's distribution accurately.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If particle size distribution is measured using sieve analysis on deposited raw material, then measurement can be performed, but the measurement precision deteriorates due to particle size segregation between surface layer and entire layer
Solution Approach 1:
The patent introduces an intermediary correction mechanism that uses easily measurable parameters (surface layer particle size distribution, layer thickness, conveyance amount) to infer and correct the particle size distribution of the entire layer. This intermediary approach bridges the gap between surface measurements and bulk material properties, resolving the contradiction between measurement accessibility and measurement accuracy.
Solution Approach 2:
The patent replaces the traditional mechanical sieve analysis method with an optical measurement system (imaging device) combined with information processing. This substitution eliminates the need for physical sieving and enables non-contact, rapid measurement while introducing correction algorithms to account for particle size segregation, thereby improving both measurement precision and representativeness.
2Measurement precision
If conventional sieve analysis is performed periodically, then particle size distribution can be obtained, but productivity deteriorates due to time consumption and inability to provide real-time data
Solution Approach 1:
The patent replaces the time-consuming mechanical sieve analysis process with an optical imaging system and automated image processing. This substitution enables continuous, real-time measurement of particle size distribution without the labor-intensive and time-consuming steps of manual sampling, sieving, and analysis, thereby dramatically improving productivity while maintaining measurement accuracy through correction algorithms.
Solution Approach 2:
The patent implements continuous measurement capability by using an imaging device that captures images of the conveyed raw material continuously rather than through periodic sampling. The image processing system continuously analyzes the captured images to provide real-time particle size distribution data, enabling continuous useful action throughout the material handling process.
3Ease of operation
If correction is performed using simple difference calculation between sieve measurement and surface layer measurement, then correction can be applied, but manufacturing precision deteriorates due to inability to account for changing raw material states
Solution Approach 1:
The patent implements a dynamic correction system that adapts to changing raw material states by incorporating multiple correction parameters (layer thickness, conveyance amount, brightness) and updating correction values based on current measurement conditions. This dynamic approach replaces static difference calculation with an adaptive correction mechanism that maintains high manufacturing precision across varying operational conditions.
Solution Approach 2:
The patent employs parameter changes by introducing multiple correction parameters (layer thickness, conveyance amount, brightness) that reflect the actual state of the raw material. By monitoring and utilizing these parameters, the system adjusts the correction applied to particle size distribution measurements, thereby maintaining high correction accuracy despite changes in raw material conditions while keeping the correction process systematically manageable.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-precision measurement of particle diameter across all layers, allowing for real-time adjustments in manufacturing processes like sintered ore and coke production, improving process stability and quality.
Implementation Method 1
acquire observation data obtained at each observation time by use of a sensor to observe a surface layer of a deposited raw material
Implementation Method 2
acquire, as the observation data, distance data obtained by measuring a distance from the sensor to the surface layer of the deposited raw material
Data Source
Figure 1~2
Figure 3
Figure 4A~4B
AI summary
An information processing apparatus (20) includes a controller configured to acquire observation data obtained at each observation time by use of a sensor (30) to observe a surface layer of a deposited raw material (12) that is sequentially conveyed, calculate an index related to a particle diameter of each particle contained in the deposited raw material (12) for each observation time using the acquired observation data, acquire measurement data obtained at each measurement time corresponding to each observation time by measuring a state of the deposited raw material (12), correct the calculated index for the observation time corresponding to each measurement time, using the acquired measurement data, and output the corrected index for each observation time.